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Ray Egerton

Showing results (1-10 of 12) with videos related to

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Ultramicroscopy|July 7, 2009
Fourier-ratio deconvolution techniques for electron energy-loss spectroscopy (EELS)Feng Wang, Ray Egerton, Marek Malac
Micron (Oxford, England : 1993)|March 26, 2014
Ethics issuesGuy Cox, Filip Braet, Ray Egerton
Micron (Oxford, England : 1993)|April 26, 2015
Bring your paper into the 'Fast Lane' of the editorial process and increase your changes for final acceptance in Micron, The International Research and Review Journal for MicroscopyFilip Braet, Ray Egerton, Guy Cox
Ultramicroscopy|March 3, 2018
Thermal expansion coefficient measurement from electron diffraction of amorphous films in a TEMMisa Hayashida, Kai Cui, Marek Malac, et al.
Ultramicroscopy|July 6, 2006
Bright-field TEM imaging of single molecules: dream or near future?Marek Malac, Marco Beleggia, Ray Egerton, et al.
Ultramicroscopy|May 19, 2007
Imaging of radiation-sensitive samples in transmission electron microscopes equipped with Zernike phase platesMarek Malac, Marco Beleggia, Ray Egerton, et al.
Micron (Oxford, England : 1993)|November 3, 2024
Bring your paper into the 'Fast Lane' of the editorial process and increase your changes for final acceptance in Micron, The International Research and Review Journal for Microscopy - Part IIFilip Braet, Roberto Romani, Ferdinand Hofer, et al.
Ultramicroscopy|April 14, 2024
Secondary-electron imaging of bulk crystalline specimens in an aberration corrected STEMSooyeon Hwang, Lijun Wu, Kim Kisslinger, et al.
Micron (Oxford, England : 1993)|September 23, 2025
Momentum-dispersion calibration and measurement of a surface layer dielectric constant using momentum-resolved electron energy-loss spectroscopy in the optical regionMisa Hayashida, Makoto Tokoro Schreiber, Heiko Müller, et al.
Micron (Oxford, England : 1993)|August 29, 2006
Valence state map of iron oxide thin film obtained from electron spectroscopy imaging seriesKo-Feng Chen, Shen-Chuan Lo, Li Chang, et al.
Pageof 2

Showing results (1-10 of 12) with videos related to

Sort By:
Pageof 2
Ultramicroscopy|July 7, 2009
Fourier-ratio deconvolution techniques for electron energy-loss spectroscopy (EELS)Feng Wang, Ray Egerton, Marek Malac
Micron (Oxford, England : 1993)|March 26, 2014
Ethics issuesGuy Cox, Filip Braet, Ray Egerton
Micron (Oxford, England : 1993)|April 26, 2015
Bring your paper into the 'Fast Lane' of the editorial process and increase your changes for final acceptance in Micron, The International Research and Review Journal for MicroscopyFilip Braet, Ray Egerton, Guy Cox
Ultramicroscopy|March 3, 2018
Thermal expansion coefficient measurement from electron diffraction of amorphous films in a TEMMisa Hayashida, Kai Cui, Marek Malac, et al.
Ultramicroscopy|July 6, 2006
Bright-field TEM imaging of single molecules: dream or near future?Marek Malac, Marco Beleggia, Ray Egerton, et al.
Ultramicroscopy|May 19, 2007
Imaging of radiation-sensitive samples in transmission electron microscopes equipped with Zernike phase platesMarek Malac, Marco Beleggia, Ray Egerton, et al.
Micron (Oxford, England : 1993)|November 3, 2024
Bring your paper into the 'Fast Lane' of the editorial process and increase your changes for final acceptance in Micron, The International Research and Review Journal for Microscopy - Part IIFilip Braet, Roberto Romani, Ferdinand Hofer, et al.
Ultramicroscopy|April 14, 2024
Secondary-electron imaging of bulk crystalline specimens in an aberration corrected STEMSooyeon Hwang, Lijun Wu, Kim Kisslinger, et al.
Micron (Oxford, England : 1993)|September 23, 2025
Momentum-dispersion calibration and measurement of a surface layer dielectric constant using momentum-resolved electron energy-loss spectroscopy in the optical regionMisa Hayashida, Makoto Tokoro Schreiber, Heiko Müller, et al.
Micron (Oxford, England : 1993)|August 29, 2006
Valence state map of iron oxide thin film obtained from electron spectroscopy imaging seriesKo-Feng Chen, Shen-Chuan Lo, Li Chang, et al.
Pageof 2