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Raynald Gauvin

Showing results (11-20 of 79) with videos related to

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Journal of Microscopy|April 20, 2017
The qualitative f-ratio method applied to electron channelling-induced x-ray imaging with an annular silicon drift detector in a scanning electron microscope in the transmission modeNicolas Brodusch, Raynald Gauvin
Ultramicroscopy|April 25, 2022
Phase differentiation based on x-ray energy spectrum correlation with an energy dispersive spectrometer (EDS)Nicolas Brodusch, Raynald Gauvin
Ultramicroscopy|March 25, 2015
Rotation axes analysis of deformed magnesium based on rotation contour contrast in a scanning electron microscopeShirin Kaboli, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 14, 2009
Introduction: 40 Years of EDSDale E Newbury, Raynald Gauvin
Talanta|July 31, 2019
The f-ratio quantification method applied to standard minerals with a cold field emission SEM/EDSChaoyi Teng, Yu Yuan, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 11, 2012
Spatial resolution optimization of backscattered electron images using Monte Carlo simulationCamille Probst, Hendrix Demers, Raynald Gauvin
Microscopy Research and Technique|October 4, 2014
Electron backscatter diffraction applied to lithium sheets prepared by broad ion beam millingNicolas Brodusch, Karim Zaghib, Raynald Gauvin
Microscopy (Oxford, England)|November 20, 2012
Flat ion milling: a powerful tool for preparation of cross-sections of lead-silver alloysNicolas Brodusch, Sophie Boisvert, Raynald Gauvin
Ultramicroscopy|November 19, 2019
Improvement of the energy resolution of energy dispersive spectrometers (EDS) using Richardson-Lucy deconvolutionNicolas Brodusch, Karim Zaghib, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 29, 2009
Charge contrast imaging of gibbsite using the variable pressure SEMKevin Robertson, Raynald Gauvin, James Finch
Pageof 8

Showing results (11-20 of 79) with videos related to

Sort By:
Pageof 8
Journal of Microscopy|April 20, 2017
The qualitative f-ratio method applied to electron channelling-induced x-ray imaging with an annular silicon drift detector in a scanning electron microscope in the transmission modeNicolas Brodusch, Raynald Gauvin
Ultramicroscopy|April 25, 2022
Phase differentiation based on x-ray energy spectrum correlation with an energy dispersive spectrometer (EDS)Nicolas Brodusch, Raynald Gauvin
Ultramicroscopy|March 25, 2015
Rotation axes analysis of deformed magnesium based on rotation contour contrast in a scanning electron microscopeShirin Kaboli, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 14, 2009
Introduction: 40 Years of EDSDale E Newbury, Raynald Gauvin
Talanta|July 31, 2019
The f-ratio quantification method applied to standard minerals with a cold field emission SEM/EDSChaoyi Teng, Yu Yuan, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 11, 2012
Spatial resolution optimization of backscattered electron images using Monte Carlo simulationCamille Probst, Hendrix Demers, Raynald Gauvin
Microscopy Research and Technique|October 4, 2014
Electron backscatter diffraction applied to lithium sheets prepared by broad ion beam millingNicolas Brodusch, Karim Zaghib, Raynald Gauvin
Microscopy (Oxford, England)|November 20, 2012
Flat ion milling: a powerful tool for preparation of cross-sections of lead-silver alloysNicolas Brodusch, Sophie Boisvert, Raynald Gauvin
Ultramicroscopy|November 19, 2019
Improvement of the energy resolution of energy dispersive spectrometers (EDS) using Richardson-Lucy deconvolutionNicolas Brodusch, Karim Zaghib, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 29, 2009
Charge contrast imaging of gibbsite using the variable pressure SEMKevin Robertson, Raynald Gauvin, James Finch
Pageof 8