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Raynald Gauvin

Showing results (21-30 of 79) with videos related to

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Ultramicroscopy|December 3, 2014
Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscopeNicolas Brodusch, Hendrix Demers, Raynald Gauvin
Journal of Microscopy|June 2, 2017
About the contrast of δ' precipitates in bulk Al-Cu-Li alloys in reflection mode with a field-emission scanning electron microscope at low accelerating voltageNicolas Brodusch, Frédéric Voisard, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 29, 2013
Dark-field imaging of thin specimens with a forescatter electron detector at low accelerating voltageNicolas Brodusch, Hendrix Demers, Raynald Gauvin
Scanning|October 28, 2021
Study of the Peak to Background (P/B) Method Behavior as a Function of Take-Off Angle, Tilt Angle, Particle Size, and Beam EnergySeyed Mahmoud Bayazid, Yu Yuan, Raynald Gauvin
Scanning|October 21, 2020
Investigation of the Effect of Magnification, Accelerating Voltage, and Working Distance on the 3D Digital Reconstruction TechniquesSeyed Mahmoud Bayazid, Nicolas Brodusch, Raynald Gauvin
Micron (Oxford, England : 1993)|October 3, 2019
Wave-packet numerical investigation of thermal diffuse scattering: A time-dependent quantum approach to electron diffraction simulationsSamantha Rudinsky, Angel S Sanz, Raynald Gauvin
Nanoscale|May 26, 2017
Nanostructural and photo-electrochemical properties of solution spin-coated Cu<sub>2</sub>ZnSnS<sub>4</sub>-TiO<sub>2</sub> nanorod forest films with an improved photovoltaic performanceZhuoran Wang, Raynald Gauvin, George P Demopoulos
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 22, 2010
Development of a new quantitative X-ray microanalysis method for electron microscopyPaula Horny, Eric Lifshin, Helen Campbell, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 15, 2019
Secondary Fluorescence Correction for Characteristic and Bremsstrahlung X-Rays Using Monte Carlo X-ray Depth Distributions Applied to Bulk and Multilayer MaterialsYu Yuan, Hendrix Demers, Samantha Rudinsky, et al.
Ultramicroscopy|November 17, 2023
Prediction of primary knock-on damage during electron microscopy characterization of lithium-containing materialsAli Jaberi, Nicolas Brodusch, Jun Song, et al.
Pageof 8

Showing results (21-30 of 79) with videos related to

Sort By:
Pageof 8
Ultramicroscopy|December 3, 2014
Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscopeNicolas Brodusch, Hendrix Demers, Raynald Gauvin
Journal of Microscopy|June 2, 2017
About the contrast of δ' precipitates in bulk Al-Cu-Li alloys in reflection mode with a field-emission scanning electron microscope at low accelerating voltageNicolas Brodusch, Frédéric Voisard, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 29, 2013
Dark-field imaging of thin specimens with a forescatter electron detector at low accelerating voltageNicolas Brodusch, Hendrix Demers, Raynald Gauvin
Scanning|October 28, 2021
Study of the Peak to Background (P/B) Method Behavior as a Function of Take-Off Angle, Tilt Angle, Particle Size, and Beam EnergySeyed Mahmoud Bayazid, Yu Yuan, Raynald Gauvin
Scanning|October 21, 2020
Investigation of the Effect of Magnification, Accelerating Voltage, and Working Distance on the 3D Digital Reconstruction TechniquesSeyed Mahmoud Bayazid, Nicolas Brodusch, Raynald Gauvin
Micron (Oxford, England : 1993)|October 3, 2019
Wave-packet numerical investigation of thermal diffuse scattering: A time-dependent quantum approach to electron diffraction simulationsSamantha Rudinsky, Angel S Sanz, Raynald Gauvin
Nanoscale|May 26, 2017
Nanostructural and photo-electrochemical properties of solution spin-coated Cu<sub>2</sub>ZnSnS<sub>4</sub>-TiO<sub>2</sub> nanorod forest films with an improved photovoltaic performanceZhuoran Wang, Raynald Gauvin, George P Demopoulos
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 22, 2010
Development of a new quantitative X-ray microanalysis method for electron microscopyPaula Horny, Eric Lifshin, Helen Campbell, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 15, 2019
Secondary Fluorescence Correction for Characteristic and Bremsstrahlung X-Rays Using Monte Carlo X-ray Depth Distributions Applied to Bulk and Multilayer MaterialsYu Yuan, Hendrix Demers, Samantha Rudinsky, et al.
Ultramicroscopy|November 17, 2023
Prediction of primary knock-on damage during electron microscopy characterization of lithium-containing materialsAli Jaberi, Nicolas Brodusch, Jun Song, et al.
Pageof 8