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Raynald Gauvin

Showing results (41-50 of 77) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 5, 2018
Use of an Annular Silicon Drift Detector (SDD) Versus a Conventional SDD Makes Phase Mapping a Practical Solution for Rare Earth Mineral CharacterizationChaoyi Teng, Hendrix Demers, Nicolas Brodusch, et al.
Physical Chemistry Chemical Physics : PCCP|February 26, 2024
Synergetic interfacial conductivity modulation dictating hysteresis evolution in perovskite solar cells under operationRana Yekani, Han Wang, Stephanie Bessette, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Win X-ray: a new Monte Carlo program that computes X-ray spectra obtained with a scanning electron microscopeRaynald Gauvin, Eric Lifshin, Hendrix Demers, et al.
Ultramicroscopy|December 12, 2024
Workflow automation of SEM acquisitions and feature trackingSabrina Clusiau, Nicolas Piché, Nicolas Brodusch, et al.
Ultramicroscopy|January 1, 2019
Electron energy-loss spectroscopy (EELS) with a cold-field emission scanning electron microscope at low accelerating voltage in transmission modeNicolas Brodusch, Hendrix Demers, Alexandra Gellé, et al.
Ultramicroscopy|September 28, 2020
Inverse modeling for quantitative X-ray microanalysis applied to 2D heterogeneous materialsYu Yuan, Hendrix Demers, Nicolas Brodusch, et al.
Scanning|August 9, 2002
A method to measure the effective gas path length in the environmental or variable pressure scanning electron microscopeRaynald Gauvin, Brendan Griffin, Clive Nockolds, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 16, 2009
Characterization of Al and Mg alloys from their X-ray emission bandsPhilippe Jonnard, Karine Le Guen, Raynald Gauvin, et al.
Faraday Discussions|May 30, 2025
Combined crystallographic study of king scallop (<i>Pecten maximus</i>) shells using SEM, EBSD and Raman spectroscopyLise Guichaoua, Natalie Reznikov, Bryce D Stewart, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 26, 2016
Monte Carlo Simulations of Electron Energy-Loss Spectra with the Addition of Fine Structure from Density Functional Theory CalculationsMohammad Attarian Shandiz, Maxime J-F Guinel, Majid Ahmadi, et al.
Pageof 8

Showing results (41-50 of 77) with videos related to

Sort By:
Pageof 8
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 5, 2018
Use of an Annular Silicon Drift Detector (SDD) Versus a Conventional SDD Makes Phase Mapping a Practical Solution for Rare Earth Mineral CharacterizationChaoyi Teng, Hendrix Demers, Nicolas Brodusch, et al.
Physical Chemistry Chemical Physics : PCCP|February 26, 2024
Synergetic interfacial conductivity modulation dictating hysteresis evolution in perovskite solar cells under operationRana Yekani, Han Wang, Stephanie Bessette, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Win X-ray: a new Monte Carlo program that computes X-ray spectra obtained with a scanning electron microscopeRaynald Gauvin, Eric Lifshin, Hendrix Demers, et al.
Ultramicroscopy|December 12, 2024
Workflow automation of SEM acquisitions and feature trackingSabrina Clusiau, Nicolas Piché, Nicolas Brodusch, et al.
Ultramicroscopy|January 1, 2019
Electron energy-loss spectroscopy (EELS) with a cold-field emission scanning electron microscope at low accelerating voltage in transmission modeNicolas Brodusch, Hendrix Demers, Alexandra Gellé, et al.
Ultramicroscopy|September 28, 2020
Inverse modeling for quantitative X-ray microanalysis applied to 2D heterogeneous materialsYu Yuan, Hendrix Demers, Nicolas Brodusch, et al.
Scanning|August 9, 2002
A method to measure the effective gas path length in the environmental or variable pressure scanning electron microscopeRaynald Gauvin, Brendan Griffin, Clive Nockolds, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 16, 2009
Characterization of Al and Mg alloys from their X-ray emission bandsPhilippe Jonnard, Karine Le Guen, Raynald Gauvin, et al.
Faraday Discussions|May 30, 2025
Combined crystallographic study of king scallop (<i>Pecten maximus</i>) shells using SEM, EBSD and Raman spectroscopyLise Guichaoua, Natalie Reznikov, Bryce D Stewart, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 26, 2016
Monte Carlo Simulations of Electron Energy-Loss Spectra with the Addition of Fine Structure from Density Functional Theory CalculationsMohammad Attarian Shandiz, Maxime J-F Guinel, Majid Ahmadi, et al.
Pageof 8