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Journal of Biological Physics|March 2, 2013
Chemical mapping of DNA and counter-ion content inside phage by energy-filtered TEMPernilla Nevsten, Alex Evilevitch, Reine WallenbergNanotechnology|May 27, 2020
Electron channelling: challenges and opportunities for compositional analysis of nanowires by TEMM Ek, Sebastian Lehmann, Reine WallenbergEnvironmental Technology|March 21, 2019
Adsorption of cadmium by a high-capacity adsorbent composed of silicate-titanate nanotubes embedded in hydrogel chitosan beadsRoxana Quiroga-Flores, Asma Noshad, Reine Wallenberg, et al.International Journal of Pharmaceutics|January 25, 2005
XEDS-mapping for explaining release patterns from single pelletsPernilla Nevsten, Per Borgquist, Anders Axelsson, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
Probing of individual semiconductor nanowhiskers by TEM-STMMagnus W Larsson, L Reine Wallenberg, Ann I Persson, et al.Journal of the American Chemical Society|November 14, 2022
Temporary Cohabitation: The Metastable Phase Au4SiJulia-Maria Hübner, Brenna C Bierman, Reine Wallenberg, et al.Journal of Controlled Release : Official Journal of the Controlled Release Society|June 24, 2004
Simulation of the release from a multiparticulate system validated by single pellet and dose release experimentsPer Borgquist, Pernilla Nevsten, Bernt Nilsson, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 1, 2022
Enabling In Situ Studies of Metal-Organic Chemical Vapor Deposition in a Transmission Electron MicroscopeMarcus Tornberg, Carina B Maliakkal, Daniel Jacobsson, et al.Nano Letters|December 14, 2011
Electron trapping in InP nanowire FETs with stacking faultsJesper Wallentin, Martin Ek, L Reine Wallenberg, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 16, 2013
FIB plan and side view cross-sectional TEM sample preparation of nanostructuresFilip Lenrick, Martin Ek, Daniel Jacobsson, et al.Pageof 6