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Remco Geurts

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 21, 2007
High-quality sample preparation by low kV FIB thinning for analytical TEM measurementsSara Bals, Wim Tirry, Remco Geurts, et al.
Micron (Oxford, England : 1993)|June 4, 2013
Evaluating focused ion beam induced damage in soft materialsRussell J Bailey, Remco Geurts, Debbie J Stokes, et al.
Chemical Reviews|May 1, 2025
FIB-SEM: Emerging Multimodal/Multiscale Characterization Techniques for Advanced Battery DevelopmentZhao Liu, Shuang Bai, Sven Burke, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 21, 2007
High-quality sample preparation by low kV FIB thinning for analytical TEM measurementsSara Bals, Wim Tirry, Remco Geurts, et al.
Micron (Oxford, England : 1993)|June 4, 2013
Evaluating focused ion beam induced damage in soft materialsRussell J Bailey, Remco Geurts, Debbie J Stokes, et al.
Chemical Reviews|May 1, 2025
FIB-SEM: Emerging Multimodal/Multiscale Characterization Techniques for Advanced Battery DevelopmentZhao Liu, Shuang Bai, Sven Burke, et al.
Pageof 1