Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Ren-Jian Feng

Showing results (1-10 of 2) with videos related to

Pageof 1
Sort By:
Journal of Electron Microscopy|January 1, 2004
Quantitative analysis of static capacitance contrast in scanning electron microscopyRen-Jian Feng, Hai-Bo Zhang, Katsumi Ura
Science Progress|July 21, 2005
Utilizing the charging effect in scanning electron microscopyHai-Bo Zhang, Ren-Jian Feng, Katsumi Ura
Pageof 1

Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Journal of Electron Microscopy|January 1, 2004
Quantitative analysis of static capacitance contrast in scanning electron microscopyRen-Jian Feng, Hai-Bo Zhang, Katsumi Ura
Science Progress|July 21, 2005
Utilizing the charging effect in scanning electron microscopyHai-Bo Zhang, Ren-Jian Feng, Katsumi Ura
Pageof 1