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Robert R Keller

Showing results (1-10 of 8) with videos related to

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Ultramicroscopy|May 15, 2016
Angularly-selective transmission imaging in a scanning electron microscopeJason Holm, Robert R Keller
Microscopy Today|January 30, 2018
Acceptance Angle Control for Improved Transmission Imaging in an SEMJason Holm, Robert R Keller
Forensic Science International|March 10, 2015
Restoration of firearm serial numbers with electron backscatter diffraction (EBSD)Ryan M White, Robert R Keller
Ultramicroscopy|October 3, 2018
Transmission imaging with a programmable detector in a scanning electron microscopeBenjamin W Caplins, Jason D Holm, Robert R Keller
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 7, 2016
Dark-Field Scanning Transmission Ion Microscopy via Detection of Forward-Scattered Helium Ions with a Microchannel PlateTaylor J Woehl, Ryan M White, Robert R Keller
Micron (Oxford, England : 1993)|February 14, 2017
Beam broadening in transmission and conventional EBSDKatherine P Rice, Yimeng Chen, Robert R Keller, et al.
Ultramicroscopy|October 23, 2020
Orientation mapping of graphene using 4D STEM-in-SEMBenjamin W Caplins, Jason D Holm, Ryan M White, et al.
Nanotechnology|May 19, 2011
Accelerated reliability testing of highly aligned single-walled carbon nanotube networks subjected to DC electrical stressingMark C Strus, Ann N Chiaramonti, Young Lae Kim, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|May 15, 2016
Angularly-selective transmission imaging in a scanning electron microscopeJason Holm, Robert R Keller
Microscopy Today|January 30, 2018
Acceptance Angle Control for Improved Transmission Imaging in an SEMJason Holm, Robert R Keller
Forensic Science International|March 10, 2015
Restoration of firearm serial numbers with electron backscatter diffraction (EBSD)Ryan M White, Robert R Keller
Ultramicroscopy|October 3, 2018
Transmission imaging with a programmable detector in a scanning electron microscopeBenjamin W Caplins, Jason D Holm, Robert R Keller
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 7, 2016
Dark-Field Scanning Transmission Ion Microscopy via Detection of Forward-Scattered Helium Ions with a Microchannel PlateTaylor J Woehl, Ryan M White, Robert R Keller
Micron (Oxford, England : 1993)|February 14, 2017
Beam broadening in transmission and conventional EBSDKatherine P Rice, Yimeng Chen, Robert R Keller, et al.
Ultramicroscopy|October 23, 2020
Orientation mapping of graphene using 4D STEM-in-SEMBenjamin W Caplins, Jason D Holm, Ryan M White, et al.
Nanotechnology|May 19, 2011
Accelerated reliability testing of highly aligned single-walled carbon nanotube networks subjected to DC electrical stressingMark C Strus, Ann N Chiaramonti, Young Lae Kim, et al.
Pageof 1