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Applied Optics
|
June 18, 2021
On-axis sample viewer with flexible working distance for an X-ray spectroscopy beamline
Roelof van Silfhout
Optics Express
|
March 14, 2013
On the resolution and linearity of lensless in situ X-ray beam diagnostics using pixelated sensors
Anton Kachatkou, Roelof van Silfhout
Journal of Synchrotron Radiation
|
December 24, 2019
White beam diagnostics using X-ray back-scattering from a CVD diamond vacuum window
Roelof van Silfhout, Daniel Pothin, Thierry Martin
Journal of Synchrotron Radiation
|
February 25, 2014
In situ micro-focused X-ray beam characterization with a lensless camera using a hybrid pixel detector
Anton Kachatkou, Julien Marchal, Roelof van Silfhout
Journal of Synchrotron Radiation
|
June 15, 2013
In situ X-ray beam imaging using an off-axis magnifying coded aperture camera system
Anton Kachatkou, Nicholas Kyele, Peter Scott, et al.
Journal of Synchrotron Radiation
|
February 25, 2014
Position and flux stabilization of X-ray beams produced by double-crystal monochromators for EXAFS scans at the titanium K-edge
Roelof van Silfhout, Anton Kachatkou, Elena Groppo, et al.
Optics Letters
|
February 18, 2011
High-resolution transparent x-ray beam location and imaging
Roelof van Silfhout, Anton Kachatkou, Nicholas Kyele, et al.
Analytical Chemistry
|
January 11, 2018
Polycapillary Optics Based Confocal Micro X-ray Fluorescence and X-ray Absorption Spectroscopy Setup at The European Synchrotron Radiation Facility Collaborative Research Group Dutch-Belgian Beamline, BM26A
Stephen Bauters, Pieter Tack, Jennifer Helen Rudloff-Grund, et al.
RSC Advances
|
May 6, 2022
A multi-technique study of altered granitic rock from the Krunkelbach Valley uranium deposit, Southern Germany
Ivan Pidchenko, Stephen Bauters, Irina Sinenko, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 9) with videos related to
Sort By:
Page
of 1
Applied Optics
|
June 18, 2021
On-axis sample viewer with flexible working distance for an X-ray spectroscopy beamline
Roelof van Silfhout
Optics Express
|
March 14, 2013
On the resolution and linearity of lensless in situ X-ray beam diagnostics using pixelated sensors
Anton Kachatkou, Roelof van Silfhout
Journal of Synchrotron Radiation
|
December 24, 2019
White beam diagnostics using X-ray back-scattering from a CVD diamond vacuum window
Roelof van Silfhout, Daniel Pothin, Thierry Martin
Journal of Synchrotron Radiation
|
February 25, 2014
In situ micro-focused X-ray beam characterization with a lensless camera using a hybrid pixel detector
Anton Kachatkou, Julien Marchal, Roelof van Silfhout
Journal of Synchrotron Radiation
|
June 15, 2013
In situ X-ray beam imaging using an off-axis magnifying coded aperture camera system
Anton Kachatkou, Nicholas Kyele, Peter Scott, et al.
Journal of Synchrotron Radiation
|
February 25, 2014
Position and flux stabilization of X-ray beams produced by double-crystal monochromators for EXAFS scans at the titanium K-edge
Roelof van Silfhout, Anton Kachatkou, Elena Groppo, et al.
Optics Letters
|
February 18, 2011
High-resolution transparent x-ray beam location and imaging
Roelof van Silfhout, Anton Kachatkou, Nicholas Kyele, et al.
Analytical Chemistry
|
January 11, 2018
Polycapillary Optics Based Confocal Micro X-ray Fluorescence and X-ray Absorption Spectroscopy Setup at The European Synchrotron Radiation Facility Collaborative Research Group Dutch-Belgian Beamline, BM26A
Stephen Bauters, Pieter Tack, Jennifer Helen Rudloff-Grund, et al.
RSC Advances
|
May 6, 2022
A multi-technique study of altered granitic rock from the Krunkelbach Valley uranium deposit, Southern Germany
Ivan Pidchenko, Stephen Bauters, Irina Sinenko, et al.
Page
of 1