White beam diagnostics using X-ray back-scattering from a CVD diamond vacuum window.

Area of Science:

• Synchrotron radiation science
• X-ray optics and instrumentation

Background:

• Synchrotron light sources produce high-intensity X-ray beams crucial for research.
• Accurate measurement of X-ray beam shape and position is vital for experimental setup and data integrity.
• Existing methods for beam characterization can be complex or intrusive.

Purpose of the Study:

• To present an efficient and reliable method for measuring the white synchrotron beam shape and position.
• To demonstrate the feasibility of this technique at high power density levels.
• To validate a non-intrusive beam measurement approach.

Main Methods:

• Utilized a pinhole X-ray camera to collect back-scattered X-rays from vacuum windows.
• Conducted measurements at the European Synchrotron Radiation Facility (ESRF) beamline ID6.
• Employed both an in-vacuum cryogenically cooled permanent-magnet undulator (CPMU18) and a traditional U32 undulator.
• Adjusted high power density levels by modifying the undulator gap.

Main Results:

• Successfully recorded synchrotron beam shape and position using a simple geometry.
• Demonstrated that the measurement can be performed without placing additional components in the beam path.
• Achieved a root-mean-square noise figure of 150 nm for beam position recording.

Conclusions:

• The back-scattered X-ray method with a pinhole camera is an effective technique for synchrotron beam characterization.
• This non-intrusive method is suitable for high-power synchrotron sources.
• The technique offers high precision for beam position monitoring.