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Journal of Synchrotron Radiation|December 24, 2019
White beam diagnostics using X-ray back-scattering from a CVD diamond vacuum windowRoelof van Silfhout, Daniel Pothin, Thierry MartinApplied Optics|June 18, 2021
On-axis sample viewer with flexible working distance for an X-ray spectroscopy beamlineRoelof van SilfhoutOptics Letters|February 18, 2011
High-resolution transparent x-ray beam location and imagingRoelof van Silfhout, Anton Kachatkou, Nicholas Kyele, et al.Optics Express|March 14, 2013
On the resolution and linearity of lensless in situ X-ray beam diagnostics using pixelated sensorsAnton Kachatkou, Roelof van SilfhoutJournal of Synchrotron Radiation|February 25, 2014
In situ micro-focused X-ray beam characterization with a lensless camera using a hybrid pixel detectorAnton Kachatkou, Julien Marchal, Roelof van SilfhoutJournal of Synchrotron Radiation|June 15, 2013
In situ X-ray beam imaging using an off-axis magnifying coded aperture camera systemAnton Kachatkou, Nicholas Kyele, Peter Scott, et al.Journal of Synchrotron Radiation|February 25, 2014
Position and flux stabilization of X-ray beams produced by double-crystal monochromators for EXAFS scans at the titanium K-edgeRoelof van Silfhout, Anton Kachatkou, Elena Groppo, et al.Analytical Chemistry|January 11, 2018
Polycapillary Optics Based Confocal Micro X-ray Fluorescence and X-ray Absorption Spectroscopy Setup at The European Synchrotron Radiation Facility Collaborative Research Group Dutch-Belgian Beamline, BM26AStephen Bauters, Pieter Tack, Jennifer Helen Rudloff-Grund, et al.RSC Advances|May 6, 2022
A multi-technique study of altered granitic rock from the Krunkelbach Valley uranium deposit, Southern GermanyIvan Pidchenko, Stephen Bauters, Irina Sinenko, et al.Journal of Synchrotron Radiation|February 24, 2006
Recent developments in X-ray imaging with micrometer spatial resolutionThierry Martin, Andreas KochPageof 15