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S Bals

Showing results (1-10 of 25) with videos related to

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Ultramicroscopy|July 6, 2005
Nonlinear imaging using annular dark field TEMS Bals, R Kilaas, C Kisielowski
Journal of Microscopy|August 30, 2008
Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAlO3/SrTiO3 multilayers prepared by focused ion beamE Montoya, S Bals, G Van Tendeloo
Ultramicroscopy|February 16, 2023
A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projectionA De Backer, S Bals, S Van Aert
Cell Calcium|June 1, 1990
Spontaneous and experimentally evoked [Ca2+]i-transients in cardiac myocytes measured by means of a fast Fura-2 techniqueS Bals, M Bechem, W Paffhausen, et al.
Nano Letters|November 25, 2010
Measuring porosity at the nanoscale by quantitative electron tomographyE Biermans, L Molina, K J Batenburg, et al.
Optics Express|November 23, 2021
Linearized radially polarized light for improved precision in strain measurements using micro-Raman spectroscopyV Prabhakara, T Nuytten, H Bender, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 5, 2013
Annular dark-field transmission electron microscopy for low contrast materialsF Leroux, E Bladt, J-P Timmermans, et al.
Ultramicroscopy|September 7, 2012
Advanced reconstruction algorithms for electron tomography: from comparison to combinationB Goris, T Roelandts, K J Batenburg, et al.
Ultramicroscopy|August 26, 2011
Exploring different inelastic projection mechanisms for electron tomographyB Goris, S Bals, W Van den Broek, et al.
Ultramicroscopy|March 16, 2012
Accurate segmentation of dense nanoparticles by partially discrete electron tomographyT Roelandts, K J Batenburg, E Biermans, et al.
Pageof 3

Showing results (1-10 of 25) with videos related to

Sort By:
Pageof 3
Ultramicroscopy|July 6, 2005
Nonlinear imaging using annular dark field TEMS Bals, R Kilaas, C Kisielowski
Journal of Microscopy|August 30, 2008
Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAlO3/SrTiO3 multilayers prepared by focused ion beamE Montoya, S Bals, G Van Tendeloo
Ultramicroscopy|February 16, 2023
A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projectionA De Backer, S Bals, S Van Aert
Cell Calcium|June 1, 1990
Spontaneous and experimentally evoked [Ca2+]i-transients in cardiac myocytes measured by means of a fast Fura-2 techniqueS Bals, M Bechem, W Paffhausen, et al.
Nano Letters|November 25, 2010
Measuring porosity at the nanoscale by quantitative electron tomographyE Biermans, L Molina, K J Batenburg, et al.
Optics Express|November 23, 2021
Linearized radially polarized light for improved precision in strain measurements using micro-Raman spectroscopyV Prabhakara, T Nuytten, H Bender, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 5, 2013
Annular dark-field transmission electron microscopy for low contrast materialsF Leroux, E Bladt, J-P Timmermans, et al.
Ultramicroscopy|September 7, 2012
Advanced reconstruction algorithms for electron tomography: from comparison to combinationB Goris, T Roelandts, K J Batenburg, et al.
Ultramicroscopy|August 26, 2011
Exploring different inelastic projection mechanisms for electron tomographyB Goris, S Bals, W Van den Broek, et al.
Ultramicroscopy|March 16, 2012
Accurate segmentation of dense nanoparticles by partially discrete electron tomographyT Roelandts, K J Batenburg, E Biermans, et al.
Pageof 3