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Ultramicroscopy|November 13, 2012
Detector non-uniformity in scanning transmission electron microscopyS D Findlay, J M LeBeauUltramicroscopy|November 18, 2011
Thermal diffuse scattering in transmission electron microscopyB D Forbes, A J D'Alfonso, S D Findlay, et al.Ultramicroscopy|September 2, 2016
Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopyJ H Dycus, W Xu, X Sang, et al.Acta Crystallographica. Section A, Foundations of Crystallography|June 24, 2005
Quantitative structure retrieval using scanning transmission electron microscopyS D FindlayPharmacoeconomics|April 4, 2001
Direct-to-consumer promotion of prescription drugs. Economic implications for patients, payers and providersS D FindlayUltramicroscopy|June 4, 2016
Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopyZ Chen, M Weyland, X Sang, et al.Ultramicroscopy|March 20, 2018
A deep convolutional neural network to analyze position averaged convergent beam electron diffraction patternsW Xu, J M LeBeauJournal of Microscopy|July 8, 2017
A reliable approach to prepare brittle semiconducting materials for cross-sectional transmission electron microscopyJ H Dycus, J M LebeauUltramicroscopy|August 12, 2009
What atomic resolution annular dark field imaging can tell us about gold nanoparticles on TiO(2) (110)S D Findlay, N Shibata, Y IkuharaUltramicroscopy|May 2, 2007
Imaging using inelastically scattered electrons in CTEM and STEM geometryS D Findlay, P Schattschneider, L J AllenPageof 6