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Ultramicroscopy|November 9, 2016
Composition measurement in substitutionally disordered materials by atomic resolution energy dispersive X-ray spectroscopy in scanning transmission electron microscopyZ Chen, D J Taplin, M Weyland, et al.Ultramicroscopy|May 4, 2010
Dynamics of annular bright field imaging in scanning transmission electron microscopyS D Findlay, N Shibata, H Sawada, et al.Ultramicroscopy|July 18, 2006
Modelling high-resolution electron microscopy based on core-loss spectroscopyL J Allen, S D Findlay, M P Oxley, et al.Oncogene|January 22, 2013
Nodal promotes invasive phenotypes via a mitogen-activated protein kinase-dependent pathwayD F Quail, G Zhang, S D Findlay, et al.Ultramicroscopy|May 21, 2017
Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metricJ A Pollock, M Weyland, D J Taplin, et al.Physical Review Letters|December 31, 2008
Contrast reversal in atomic-resolution chemical mappingP Wang, A J D'Alfonso, S D Findlay, et al.Physical Review Letters|October 4, 2003
Atomic-resolution electron energy loss spectroscopy imaging in aberration corrected scanning transmission electron microscopyL J Allen, S D Findlay, A R Lupini, et al.Physical Review Letters|April 28, 2009
Interface structures of gold nanoparticles on TiO2 (110)N Shibata, A Goto, K Matsunaga, et al.Ultramicroscopy|May 26, 2015
Energy dispersive X-ray analysis on an absolute scale in scanning transmission electron microscopyZ Chen, A J D'Alfonso, M Weyland, et al.Science (New York, N.Y.)|October 25, 2008
Direct imaging of reconstructed atoms on TiO2 (110) surfacesN Shibata, A Goto, S-Y Choi, et al.Pageof 6