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Ultramicroscopy|November 24, 2004
Modeling electric-field-sensitive scanning probe measurements for a tip of arbitrary shapeIrma Kuljanishvili, Subhasish Chakraborty, I J Maasilta, et al.
Nano Letters|October 26, 2011
Single-electron capacitance spectroscopy of individual dopants in siliconM Gasseller, M DeNinno, R Loo, et al.
Physical Review Letters|June 29, 2006
Local atomic structure and discommensurations in the charge density wave of CeTe3H J Kim, C D Malliakas, A T Tomić, et al.
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