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S Schamm

Showing results (1-10 of 10) with videos related to

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Ultramicroscopy|July 21, 2001
Contamination and the quantitative exploitation of EELS low-loss experimentsS Schamm, G Zanchi
Ultramicroscopy|July 23, 2003
Study of the dielectric properties near the band gap by VEELS: gap measurement in bulk materialsS Schamm, G Zanchi
Ultramicroscopy|June 28, 2023
Corrigendum to 'Quantitative mapping of strain and displacement fields over HR-TEM and HR-STEM images of crystals with reference to a virtual lattice' Ultramicroscopy 253 (2023) 113778>N Cherkashin, A Louiset, A Chmielewski, et al.
Ultramicroscopy|June 17, 2023
Quantitative mapping of strain and displacement fields over HR-TEM and HR-STEM images of crystals with reference to a virtual latticeN Cherkashin, A Louiset, A Chmielewski, et al.
Nanotechnology|July 29, 2011
The fabrication of tunable nanoporous oxide surfaces by block copolymer lithography and atomic layer depositionA Andreozzi, L Lamagna, G Seguini, et al.
Nanotechnology|January 30, 2013
In-plane organization of silicon nanocrystals embedded in SiO2 thin filmsC Castro, S Schamm-Chardon, B Pecassou, et al.
Nanotechnology|February 2, 2012
Extraction of the characteristics of Si nanocrystals by the charge pumping techniqueR Diaz, J Grisolia, G BenAssayag, et al.
Nanotechnology|July 9, 2009
Temperature-dependent low electric field charging of Si nanocrystals embedded within oxide-nitride-oxide dielectric stacksN Nikolaou, P Dimitrakis, P Normand, et al.
Ultramicroscopy|July 10, 2007
Imaging Si nanoparticles embedded in SiO(2) layers by (S)TEM-EELSS Schamm, C Bonafos, H Coffin, et al.
Nanotechnology|May 3, 2024
Shaping single crystalline BaTiO<sub>3</sub>nanostructures by focused neon or helium ion millingI I Olaniyan, S W Schmitt, J Albert, et al.
Pageof 1

Showing results (1-10 of 10) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|July 21, 2001
Contamination and the quantitative exploitation of EELS low-loss experimentsS Schamm, G Zanchi
Ultramicroscopy|July 23, 2003
Study of the dielectric properties near the band gap by VEELS: gap measurement in bulk materialsS Schamm, G Zanchi
Ultramicroscopy|June 28, 2023
Corrigendum to 'Quantitative mapping of strain and displacement fields over HR-TEM and HR-STEM images of crystals with reference to a virtual lattice' Ultramicroscopy 253 (2023) 113778>N Cherkashin, A Louiset, A Chmielewski, et al.
Ultramicroscopy|June 17, 2023
Quantitative mapping of strain and displacement fields over HR-TEM and HR-STEM images of crystals with reference to a virtual latticeN Cherkashin, A Louiset, A Chmielewski, et al.
Nanotechnology|July 29, 2011
The fabrication of tunable nanoporous oxide surfaces by block copolymer lithography and atomic layer depositionA Andreozzi, L Lamagna, G Seguini, et al.
Nanotechnology|January 30, 2013
In-plane organization of silicon nanocrystals embedded in SiO2 thin filmsC Castro, S Schamm-Chardon, B Pecassou, et al.
Nanotechnology|February 2, 2012
Extraction of the characteristics of Si nanocrystals by the charge pumping techniqueR Diaz, J Grisolia, G BenAssayag, et al.
Nanotechnology|July 9, 2009
Temperature-dependent low electric field charging of Si nanocrystals embedded within oxide-nitride-oxide dielectric stacksN Nikolaou, P Dimitrakis, P Normand, et al.
Ultramicroscopy|July 10, 2007
Imaging Si nanoparticles embedded in SiO(2) layers by (S)TEM-EELSS Schamm, C Bonafos, H Coffin, et al.
Nanotechnology|May 3, 2024
Shaping single crystalline BaTiO<sub>3</sub>nanostructures by focused neon or helium ion millingI I Olaniyan, S W Schmitt, J Albert, et al.
Pageof 1