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Ultramicroscopy|July 21, 2001
Contamination and the quantitative exploitation of EELS low-loss experimentsS Schamm, G ZanchiUltramicroscopy|July 23, 2003
Study of the dielectric properties near the band gap by VEELS: gap measurement in bulk materialsS Schamm, G ZanchiUltramicroscopy|June 17, 2023
Quantitative mapping of strain and displacement fields over HR-TEM and HR-STEM images of crystals with reference to a virtual latticeN Cherkashin, A Louiset, A Chmielewski, et al.Nanotechnology|July 29, 2011
The fabrication of tunable nanoporous oxide surfaces by block copolymer lithography and atomic layer depositionA Andreozzi, L Lamagna, G Seguini, et al.Nanotechnology|January 30, 2013
In-plane organization of silicon nanocrystals embedded in SiO2 thin filmsC Castro, S Schamm-Chardon, B Pecassou, et al.IEEE Transactions on Microwave Theory and Techniques|September 4, 2010
Frequency-Offset Cartesian Feedback Based on Polyphase Difference AmplifiersMarta G Zanchi, John M Pauly, Greig C ScottNanotechnology|February 2, 2012
Extraction of the characteristics of Si nanocrystals by the charge pumping techniqueR Diaz, J Grisolia, G BenAssayag, et al.Nanotechnology|July 9, 2009
Temperature-dependent low electric field charging of Si nanocrystals embedded within oxide-nitride-oxide dielectric stacksN Nikolaou, P Dimitrakis, P Normand, et al.IEEE Transactions on Medical Imaging|September 18, 2009
An optically coupled system for quantitative monitoring of MRI-induced RF currents into long conductorsMarta G Zanchi, Ross Venook, John M Pauly, et al.Ultramicroscopy|July 10, 2007
Imaging Si nanoparticles embedded in SiO(2) layers by (S)TEM-EELSS Schamm, C Bonafos, H Coffin, et al.Pageof 2