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S Van Aert

Showing results (21-30 of 57) with videos related to

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Ultramicroscopy|December 15, 2010
Throughput maximization of particle radius measurements through balancing size versus current of the electron probeW Van den Broek, S Van Aert, P Goos, et al.
Ultramicroscopy|October 1, 2023
Atom counting from a combination of two ADF STEM imagesD G Şentürk, C P Yu, A De Backer, et al.
Ultramicroscopy|November 26, 2013
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopyG T Martinez, A Rosenauer, A De Backer, et al.
Micron (Oxford, England : 1993)|January 28, 2014
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy imagesG T Martinez, A De Backer, A Rosenauer, et al.
Ultramicroscopy|June 2, 2006
An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic imagesM D Croitoru, D Van Dyck, S Van Aert, et al.
Ultramicroscopy|January 2, 2007
Electron channelling based crystallographyS Van Aert, P Geuens, D Van Dyck, et al.
Ultramicroscopy|July 4, 2013
Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?A J den Dekker, J Gonnissen, A De Backer, et al.
Journal of Structural Biology|August 6, 2002
High-resolution electron microscopy and electron tomography: resolution versus precisionS Van Aert, A J den Dekker, D Van Dyck, et al.
Ultramicroscopy|March 12, 2017
Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structureM Alania, T Altantzis, A De Backer, et al.
Ultramicroscopy|June 29, 2005
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: a theoretical frameworkA J den Dekker, S Van Aert, A van den Bos, et al.
Pageof 6

Showing results (21-30 of 57) with videos related to

Sort By:
Pageof 6
Ultramicroscopy|December 15, 2010
Throughput maximization of particle radius measurements through balancing size versus current of the electron probeW Van den Broek, S Van Aert, P Goos, et al.
Ultramicroscopy|October 1, 2023
Atom counting from a combination of two ADF STEM imagesD G Şentürk, C P Yu, A De Backer, et al.
Ultramicroscopy|November 26, 2013
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopyG T Martinez, A Rosenauer, A De Backer, et al.
Micron (Oxford, England : 1993)|January 28, 2014
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy imagesG T Martinez, A De Backer, A Rosenauer, et al.
Ultramicroscopy|June 2, 2006
An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic imagesM D Croitoru, D Van Dyck, S Van Aert, et al.
Ultramicroscopy|January 2, 2007
Electron channelling based crystallographyS Van Aert, P Geuens, D Van Dyck, et al.
Ultramicroscopy|July 4, 2013
Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?A J den Dekker, J Gonnissen, A De Backer, et al.
Journal of Structural Biology|August 6, 2002
High-resolution electron microscopy and electron tomography: resolution versus precisionS Van Aert, A J den Dekker, D Van Dyck, et al.
Ultramicroscopy|March 12, 2017
Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structureM Alania, T Altantzis, A De Backer, et al.
Ultramicroscopy|June 29, 2005
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: a theoretical frameworkA J den Dekker, S Van Aert, A van den Bos, et al.
Pageof 6