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Sandra Van Aert

Showing results (11-20 of 59) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 25, 2022
Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEMChu-Ping Yu, Thomas Friedrich, Daen Jannis, et al.
Ultramicroscopy|January 9, 2023
Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditionsZezhong Zhang, Ivan Lobato, Annick De Backer, et al.
Ultramicroscopy|November 15, 2025
Secondary electron topographical contrast formation in scanning transmission electron microscopyEvgenii Vlasov, Wouter Heyvaert, Tom Stoops, et al.
Advanced Materials (Deerfield Beach, Fla.)|August 22, 2012
Advanced electron microscopy for advanced materialsGustaaf Van Tendeloo, Sara Bals, Sandra Van Aert, et al.
Ultramicroscopy|December 11, 2024
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimizationDaen Jannis, Wouter Van den Broek, Zezhong Zhang, et al.
Nature|February 4, 2011
Three-dimensional atomic imaging of crystalline nanoparticlesSandra Van Aert, Kees J Batenburg, Marta D Rossell, et al.
Ultramicroscopy|August 21, 2013
Introduction to a special issue in honour of W. Owen Saxton, David J. Smith and Dirk Van Dyck on the occasion of their 65th birthdaysRafal E Dunin-Borkowski, Hannes Lichte, Karsten Tillmann, et al.
Ultramicroscopy|March 16, 2017
Hybrid statistics-simulations based method for atom-counting from ADF STEM imagesAnnelies De Wael, Annick De Backer, Lewys Jones, et al.
Physical Review Letters|March 29, 2020
Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron MicroscopyAnnelies De Wael, Annick De Backer, Lewys Jones, et al.
Physical Review Letters|March 2, 2019
Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron MicroscopySandra Van Aert, Annick De Backer, Lewys Jones, et al.
Pageof 6

Showing results (11-20 of 59) with videos related to

Sort By:
Pageof 6
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 25, 2022
Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEMChu-Ping Yu, Thomas Friedrich, Daen Jannis, et al.
Ultramicroscopy|January 9, 2023
Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditionsZezhong Zhang, Ivan Lobato, Annick De Backer, et al.
Ultramicroscopy|November 15, 2025
Secondary electron topographical contrast formation in scanning transmission electron microscopyEvgenii Vlasov, Wouter Heyvaert, Tom Stoops, et al.
Advanced Materials (Deerfield Beach, Fla.)|August 22, 2012
Advanced electron microscopy for advanced materialsGustaaf Van Tendeloo, Sara Bals, Sandra Van Aert, et al.
Ultramicroscopy|December 11, 2024
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimizationDaen Jannis, Wouter Van den Broek, Zezhong Zhang, et al.
Nature|February 4, 2011
Three-dimensional atomic imaging of crystalline nanoparticlesSandra Van Aert, Kees J Batenburg, Marta D Rossell, et al.
Ultramicroscopy|August 21, 2013
Introduction to a special issue in honour of W. Owen Saxton, David J. Smith and Dirk Van Dyck on the occasion of their 65th birthdaysRafal E Dunin-Borkowski, Hannes Lichte, Karsten Tillmann, et al.
Ultramicroscopy|March 16, 2017
Hybrid statistics-simulations based method for atom-counting from ADF STEM imagesAnnelies De Wael, Annick De Backer, Lewys Jones, et al.
Physical Review Letters|March 29, 2020
Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron MicroscopyAnnelies De Wael, Annick De Backer, Lewys Jones, et al.
Physical Review Letters|March 2, 2019
Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron MicroscopySandra Van Aert, Annick De Backer, Lewys Jones, et al.
Pageof 6