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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 27, 2021
Scattering Matrix Determination in Crystalline Materials from 4D Scanning Transmission Electron Microscopy at a Single Defocus ValueScott D Findlay, Hamish G Brown, Philipp M Pelz, et al.
Accounts of Chemical Research|July 6, 2017
Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron MicroscopyNaoya Shibata, Scott D Findlay, Takao Matsumoto, et al.
Ultramicroscopy|August 1, 2006
Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopyKlaus van Benthem, Andrew R Lupini, Mark P Oxley, et al.
Physical Review Letters|November 7, 2014
Direct observation of dopant atom diffusion in a bulk semiconductor crystal enhanced by a large size mismatchRyo Ishikawa, Rohan Mishra, Andrew R Lupini, et al.
Nature Communications|May 31, 2017
Electric field imaging of single atomsNaoya Shibata, Takehito Seki, Gabriel Sánchez-Santolino, et al.
Scientific Reports|June 13, 2015
Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopyNaoya Shibata, Scott D Findlay, Hirokazu Sasaki, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 12, 2021
Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic ScaleKatherine E MacArthur, Andrew B Yankovich, Armand Béché, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 10, 2025
Quantitative Structure Determination from Experimental Four-Dimensional Scanning Transmission Electron Microscopy via the Scattering MatrixEmmanuel W C Terzoudis-Lumsden, Alireza Sadri, Matthew Weyland, et al.
Ultramicroscopy|July 31, 2022
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopyTakehito Seki, Kushagra Khare, Yoshiki O Murakami, et al.
ACS Nano|August 4, 2018
Probing the Internal Atomic Charge Density Distributions in Real SpaceGabriel Sánchez-Santolino, Nathan R Lugg, Takehito Seki, et al.
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