Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Sefik Suzer

Showing results (11-20 of 30) with videos related to

Pageof 3
Sort By:
Analytical Chemistry|February 29, 2012
XPS investigation of a CdS-based photoresistor under working conditions: operando-XPSHikmet Sezen, Angus A Rockett, Sefik Suzer
Langmuir : the ACS Journal of Surfaces and Colloids|June 6, 2018
DC Electrowetting of Nonaqueous Liquid Revisited by XPSPinar Aydogan Gokturk, Burak Ulgut, Sefik Suzer
Langmuir : the ACS Journal of Surfaces and Colloids|February 16, 2019
AC Electrowetting Modulation of Low-Volatile Liquids Probed by XPS: Dipolar vs Ionic ScreeningPinar Aydogan Gokturk, Burak Ulgut, Sefik Suzer
Analytical Methods : Advancing Methods and Applications|March 9, 2026
Use of ATR-FTIR with D/H substitution for assessing water uptake in alkali perchlorate matricesMohammed Alfatih Hamid, Ezgi Kutbay, Sefik Suzer
Langmuir : the ACS Journal of Surfaces and Colloids|December 29, 2004
X-ray-induced production of gold nanoparticles on a SiO(2)/Si system and in a poly(methyl methacrylate) matrixFerdi Karadas, Gulay Ertas, Eda Ozkaraoglu, et al.
Scientific Reports|September 12, 2015
Chemical Visualization of a GaN p-n junction by XPSDeniz Caliskan, Hikmet Sezen, Ekmel Ozbay, et al.
The Journal of Physical Chemistry Letters|August 20, 2025
Unveiling Ionic/Electronic Contributions to the Potential Development of Electrical Double Layer Using XPSEzgi Kutbay, Burak Ulgut, Coskun Kocabas, et al.
Chemphyschem : a European Journal of Chemical Physics and Physical Chemistry|September 21, 2020
Surface Propensity of Anions in a Binary Ionic-Liquid Mixture Assessed by Full-Range Angle-Resolved X-ray Photoelectron Spectroscopy and Surface-Tension MeasurementsErdinc Oz, Ozgur Sahin, Halil I Okur, et al.
The Journal of Physical Chemistry. B|February 14, 2006
X-ray photoelectron spectroscopic analysis of Si nanoclusters in SiO2 matrixAykutlu Dane, U Korcan Demirok, Atilla Aydinli, et al.
ACS Applied Materials & Interfaces|June 19, 2013
Band-bending at buried SiO2/Si interface as probed by XPSMehmet Çopuroğlu, Hikmet Sezen, Robert L Opila, et al.
Pageof 3

Showing results (11-20 of 30) with videos related to

Sort By:
Pageof 3
Analytical Chemistry|February 29, 2012
XPS investigation of a CdS-based photoresistor under working conditions: operando-XPSHikmet Sezen, Angus A Rockett, Sefik Suzer
Langmuir : the ACS Journal of Surfaces and Colloids|June 6, 2018
DC Electrowetting of Nonaqueous Liquid Revisited by XPSPinar Aydogan Gokturk, Burak Ulgut, Sefik Suzer
Langmuir : the ACS Journal of Surfaces and Colloids|February 16, 2019
AC Electrowetting Modulation of Low-Volatile Liquids Probed by XPS: Dipolar vs Ionic ScreeningPinar Aydogan Gokturk, Burak Ulgut, Sefik Suzer
Analytical Methods : Advancing Methods and Applications|March 9, 2026
Use of ATR-FTIR with D/H substitution for assessing water uptake in alkali perchlorate matricesMohammed Alfatih Hamid, Ezgi Kutbay, Sefik Suzer
Langmuir : the ACS Journal of Surfaces and Colloids|December 29, 2004
X-ray-induced production of gold nanoparticles on a SiO(2)/Si system and in a poly(methyl methacrylate) matrixFerdi Karadas, Gulay Ertas, Eda Ozkaraoglu, et al.
Scientific Reports|September 12, 2015
Chemical Visualization of a GaN p-n junction by XPSDeniz Caliskan, Hikmet Sezen, Ekmel Ozbay, et al.
The Journal of Physical Chemistry Letters|August 20, 2025
Unveiling Ionic/Electronic Contributions to the Potential Development of Electrical Double Layer Using XPSEzgi Kutbay, Burak Ulgut, Coskun Kocabas, et al.
Chemphyschem : a European Journal of Chemical Physics and Physical Chemistry|September 21, 2020
Surface Propensity of Anions in a Binary Ionic-Liquid Mixture Assessed by Full-Range Angle-Resolved X-ray Photoelectron Spectroscopy and Surface-Tension MeasurementsErdinc Oz, Ozgur Sahin, Halil I Okur, et al.
The Journal of Physical Chemistry. B|February 14, 2006
X-ray photoelectron spectroscopic analysis of Si nanoclusters in SiO2 matrixAykutlu Dane, U Korcan Demirok, Atilla Aydinli, et al.
ACS Applied Materials & Interfaces|June 19, 2013
Band-bending at buried SiO2/Si interface as probed by XPSMehmet Çopuroğlu, Hikmet Sezen, Robert L Opila, et al.
Pageof 3