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Seiji Higuchi

Showing results (1-10 of 6) with videos related to

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Journal of Combinatorial Chemistry|May 9, 2006
A method for combinatorial fabrication and characterization of organic/inorganic thin film devices in UHVStefan Egger, Seiji Higuchi, Tomonobu Nakayama
Scientific Reports|September 4, 2024
PI gain tuning for pressure-based MFCs with Gaussian mixture modelSeiji Higuchi, Takayuki Ueda, Kotaro Takijiri, et al.
Nanotechnology|June 11, 2011
A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materialsSeiji Higuchi, Osamu Kubo, Hiromi Kuramochi, et al.
The Review of Scientific Instruments|May 3, 2011
Angled long tip to tuning fork probes for atomic force microscopy in various environmentsSeiji Higuchi, Hiromi Kuramochi, Osamu Kubo, et al.
The Review of Scientific Instruments|August 7, 2010
Multiple-scanning-probe tunneling microscope with nanoscale positional recognition functionSeiji Higuchi, Hiromi Kuramochi, Olivier Laurent, et al.
Advanced Materials (Deerfield Beach, Fla.)|March 2, 2012
Development and application of multiple-probe scanning probe microscopesTomonobu Nakayama, Osamu Kubo, Yoshitaka Shingaya, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Journal of Combinatorial Chemistry|May 9, 2006
A method for combinatorial fabrication and characterization of organic/inorganic thin film devices in UHVStefan Egger, Seiji Higuchi, Tomonobu Nakayama
Scientific Reports|September 4, 2024
PI gain tuning for pressure-based MFCs with Gaussian mixture modelSeiji Higuchi, Takayuki Ueda, Kotaro Takijiri, et al.
Nanotechnology|June 11, 2011
A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materialsSeiji Higuchi, Osamu Kubo, Hiromi Kuramochi, et al.
The Review of Scientific Instruments|May 3, 2011
Angled long tip to tuning fork probes for atomic force microscopy in various environmentsSeiji Higuchi, Hiromi Kuramochi, Osamu Kubo, et al.
The Review of Scientific Instruments|August 7, 2010
Multiple-scanning-probe tunneling microscope with nanoscale positional recognition functionSeiji Higuchi, Hiromi Kuramochi, Olivier Laurent, et al.
Advanced Materials (Deerfield Beach, Fla.)|March 2, 2012
Development and application of multiple-probe scanning probe microscopesTomonobu Nakayama, Osamu Kubo, Yoshitaka Shingaya, et al.
Pageof 1