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Journal of Physics. Condensed Matter : an Institute of Physics Journal
|
October 15, 2020
Defect identification and statistics toolbox: automated defect analysis for scanning probe microscopy images
Alana Gudinas, Jason Moscatello, Shawna M Hollen
ACS Nano
|
March 8, 2013
Progress, challenges, and opportunities in two-dimensional materials beyond graphene
Sheneve Z Butler, Shawna M Hollen, Linyou Cao, et al.
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of 1
Search research articles
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Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
Journal of Physics. Condensed Matter : an Institute of Physics Journal
|
October 15, 2020
Defect identification and statistics toolbox: automated defect analysis for scanning probe microscopy images
Alana Gudinas, Jason Moscatello, Shawna M Hollen
ACS Nano
|
March 8, 2013
Progress, challenges, and opportunities in two-dimensional materials beyond graphene
Sheneve Z Butler, Shawna M Hollen, Linyou Cao, et al.
Page
of 1