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Shigeto Isakozawa

Showing results (1-10 of 8) with videos related to

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Microscopy (Oxford, England)|January 30, 2018
Spot auto-focusing and spot auto-stigmation methods with high-definition auto-correlation function in high-resolution TEMShigeto Isakozawa, Taishi Fuse, Junpei Amano, et al.
Microscopy (Oxford, England)|May 16, 2014
High-precision image-drift-correction method for EM images with a low signal-to-noise ratioShigeto Isakozawa, Sachihiko Tomonaga, Takahito Hashimoto, et al.
Journal of Electron Microscopy|February 6, 2007
Development of dedicated STEM with high stabilityKoji Kimoto, Kuniyasu Nakamura, Shinji Aizawa, et al.
Journal of Electron Microscopy|March 7, 2008
The development and characteristics of a high-speed EELS mapping system for a dedicated STEMShigeto Isakozawa, Kazutoshi Kaji, Konrad Jarausch, et al.
Microscopy (Oxford, England)|September 11, 2019
Generalized spot auto-focusing method with a high-definition auto-correlation function in transmission electron microscopyShigeto Isakozawa, Misuzu Baba, Junpei Amano, et al.
Microscopy (Oxford, England)|November 1, 2014
Fast auto-acquisition tomography tilt series by using HD video camera in ultra-high voltage electron microscopeRyuji Nishi, Meng Cao, Atsuko Kanaji, et al.
Journal of Electron Microscopy|June 10, 2010
The development of a new windowless XEDS detectorShigeto Isakozawa, Kazutoshi Kaji, Keiji Tamura, et al.
Microscopy (Oxford, England)|May 5, 2016
Design of a 300-kV gas environmental transmission electron microscope equipped with a cold field emission gunShigeto Isakozawa, Isao Nagaoki, Akira Watabe, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Microscopy (Oxford, England)|January 30, 2018
Spot auto-focusing and spot auto-stigmation methods with high-definition auto-correlation function in high-resolution TEMShigeto Isakozawa, Taishi Fuse, Junpei Amano, et al.
Microscopy (Oxford, England)|May 16, 2014
High-precision image-drift-correction method for EM images with a low signal-to-noise ratioShigeto Isakozawa, Sachihiko Tomonaga, Takahito Hashimoto, et al.
Journal of Electron Microscopy|February 6, 2007
Development of dedicated STEM with high stabilityKoji Kimoto, Kuniyasu Nakamura, Shinji Aizawa, et al.
Journal of Electron Microscopy|March 7, 2008
The development and characteristics of a high-speed EELS mapping system for a dedicated STEMShigeto Isakozawa, Kazutoshi Kaji, Konrad Jarausch, et al.
Microscopy (Oxford, England)|September 11, 2019
Generalized spot auto-focusing method with a high-definition auto-correlation function in transmission electron microscopyShigeto Isakozawa, Misuzu Baba, Junpei Amano, et al.
Microscopy (Oxford, England)|November 1, 2014
Fast auto-acquisition tomography tilt series by using HD video camera in ultra-high voltage electron microscopeRyuji Nishi, Meng Cao, Atsuko Kanaji, et al.
Journal of Electron Microscopy|June 10, 2010
The development of a new windowless XEDS detectorShigeto Isakozawa, Kazutoshi Kaji, Keiji Tamura, et al.
Microscopy (Oxford, England)|May 5, 2016
Design of a 300-kV gas environmental transmission electron microscope equipped with a cold field emission gunShigeto Isakozawa, Isao Nagaoki, Akira Watabe, et al.
Pageof 1