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Ultramicroscopy
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June 11, 2022
Theoretical study on sixth-order geometrical aberration correction
Shigeyuki Morishita, Hidetaka Sawada
Journal of Electron Microscopy
|
February 16, 2011
Estimation of wave fields of incident beams in a transmission electron microscope by using a small selected-area aperture
Shigeyuki Morishita, Jun Yamasaki, Nobuo Tanaka
Ultramicroscopy
|
April 3, 2013
Measurement of spatial coherence of electron beams by using a small selected-area aperture
Shigeyuki Morishita, Jun Yamasaki, Nobuo Tanaka
Microscopy (Oxford, England)
|
January 15, 2022
Development of tilt-scan system for differential phase contrast scanning transmission electron microscopy
Yuji Kohno, Akiho Nakamura, Shigeyuki Morishita, et al.
Physical Review Letters
|
October 22, 2016
Atomic Resolution Imaging at an Ultralow Accelerating Voltage by a Monochromatic Transmission Electron Microscope
Shigeyuki Morishita, Masaki Mukai, Kazu Suenaga, et al.
FEMS Microbiology Ecology
|
November 22, 2012
Characterization of 2,4-dichlorophenoxyacetic acid and 2,4,5-trichlorophenoxyacetic acid-degrading fungi in Vietnamese soils
Kazuhito Itoh, Masahiro Kinoshita, Shigeyuki Morishita, et al.
Microscopy (Oxford, England)
|
September 12, 2022
Spatial and phase resolution in electron microscopy
Ryo Ishikawa, Shigeyuki Morishita, Toshiaki Tanigaki, et al.
Microscopy (Oxford, England)
|
February 24, 2018
Evaluation of residual aberration in fifth-order geometrical aberration correctors
Shigeyuki Morishita, Yuji Kohno, Fumio Hosokawa, et al.
Nature
|
August 14, 2019
Position and momentum mapping of vibrations in graphene nanostructures
Ryosuke Senga, Kazu Suenaga, Paolo Barone, et al.
Microscopy (Oxford, England)
|
January 9, 2018
Attainment of 40.5 pm spatial resolution using 300 kV scanning transmission electron microscope equipped with fifth-order aberration corrector
Shigeyuki Morishita, Ryo Ishikawa, Yuji Kohno, et al.
Page
of 2
Search research articles
Search
Showing results (1-10 of 16) with videos related to
Sort By:
Page
of 2
Ultramicroscopy
|
June 11, 2022
Theoretical study on sixth-order geometrical aberration correction
Shigeyuki Morishita, Hidetaka Sawada
Journal of Electron Microscopy
|
February 16, 2011
Estimation of wave fields of incident beams in a transmission electron microscope by using a small selected-area aperture
Shigeyuki Morishita, Jun Yamasaki, Nobuo Tanaka
Ultramicroscopy
|
April 3, 2013
Measurement of spatial coherence of electron beams by using a small selected-area aperture
Shigeyuki Morishita, Jun Yamasaki, Nobuo Tanaka
Microscopy (Oxford, England)
|
January 15, 2022
Development of tilt-scan system for differential phase contrast scanning transmission electron microscopy
Yuji Kohno, Akiho Nakamura, Shigeyuki Morishita, et al.
Physical Review Letters
|
October 22, 2016
Atomic Resolution Imaging at an Ultralow Accelerating Voltage by a Monochromatic Transmission Electron Microscope
Shigeyuki Morishita, Masaki Mukai, Kazu Suenaga, et al.
FEMS Microbiology Ecology
|
November 22, 2012
Characterization of 2,4-dichlorophenoxyacetic acid and 2,4,5-trichlorophenoxyacetic acid-degrading fungi in Vietnamese soils
Kazuhito Itoh, Masahiro Kinoshita, Shigeyuki Morishita, et al.
Microscopy (Oxford, England)
|
September 12, 2022
Spatial and phase resolution in electron microscopy
Ryo Ishikawa, Shigeyuki Morishita, Toshiaki Tanigaki, et al.
Microscopy (Oxford, England)
|
February 24, 2018
Evaluation of residual aberration in fifth-order geometrical aberration correctors
Shigeyuki Morishita, Yuji Kohno, Fumio Hosokawa, et al.
Nature
|
August 14, 2019
Position and momentum mapping of vibrations in graphene nanostructures
Ryosuke Senga, Kazu Suenaga, Paolo Barone, et al.
Microscopy (Oxford, England)
|
January 9, 2018
Attainment of 40.5 pm spatial resolution using 300 kV scanning transmission electron microscope equipped with fifth-order aberration corrector
Shigeyuki Morishita, Ryo Ishikawa, Yuji Kohno, et al.
Page
of 2