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Shigeyuki Morishita

Showing results (1-10 of 16) with videos related to

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Ultramicroscopy|June 11, 2022
Theoretical study on sixth-order geometrical aberration correctionShigeyuki Morishita, Hidetaka Sawada
Journal of Electron Microscopy|February 16, 2011
Estimation of wave fields of incident beams in a transmission electron microscope by using a small selected-area apertureShigeyuki Morishita, Jun Yamasaki, Nobuo Tanaka
Ultramicroscopy|April 3, 2013
Measurement of spatial coherence of electron beams by using a small selected-area apertureShigeyuki Morishita, Jun Yamasaki, Nobuo Tanaka
Microscopy (Oxford, England)|January 15, 2022
Development of tilt-scan system for differential phase contrast scanning transmission electron microscopyYuji Kohno, Akiho Nakamura, Shigeyuki Morishita, et al.
Physical Review Letters|October 22, 2016
Atomic Resolution Imaging at an Ultralow Accelerating Voltage by a Monochromatic Transmission Electron MicroscopeShigeyuki Morishita, Masaki Mukai, Kazu Suenaga, et al.
FEMS Microbiology Ecology|November 22, 2012
Characterization of 2,4-dichlorophenoxyacetic acid and 2,4,5-trichlorophenoxyacetic acid-degrading fungi in Vietnamese soilsKazuhito Itoh, Masahiro Kinoshita, Shigeyuki Morishita, et al.
Microscopy (Oxford, England)|September 12, 2022
Spatial and phase resolution in electron microscopyRyo Ishikawa, Shigeyuki Morishita, Toshiaki Tanigaki, et al.
Microscopy (Oxford, England)|February 24, 2018
Evaluation of residual aberration in fifth-order geometrical aberration correctorsShigeyuki Morishita, Yuji Kohno, Fumio Hosokawa, et al.
Nature|August 14, 2019
Position and momentum mapping of vibrations in graphene nanostructuresRyosuke Senga, Kazu Suenaga, Paolo Barone, et al.
Microscopy (Oxford, England)|January 9, 2018
Attainment of 40.5 pm spatial resolution using 300 kV scanning transmission electron microscope equipped with fifth-order aberration correctorShigeyuki Morishita, Ryo Ishikawa, Yuji Kohno, et al.
Pageof 2

Showing results (1-10 of 16) with videos related to

Sort By:
Pageof 2
Ultramicroscopy|June 11, 2022
Theoretical study on sixth-order geometrical aberration correctionShigeyuki Morishita, Hidetaka Sawada
Journal of Electron Microscopy|February 16, 2011
Estimation of wave fields of incident beams in a transmission electron microscope by using a small selected-area apertureShigeyuki Morishita, Jun Yamasaki, Nobuo Tanaka
Ultramicroscopy|April 3, 2013
Measurement of spatial coherence of electron beams by using a small selected-area apertureShigeyuki Morishita, Jun Yamasaki, Nobuo Tanaka
Microscopy (Oxford, England)|January 15, 2022
Development of tilt-scan system for differential phase contrast scanning transmission electron microscopyYuji Kohno, Akiho Nakamura, Shigeyuki Morishita, et al.
Physical Review Letters|October 22, 2016
Atomic Resolution Imaging at an Ultralow Accelerating Voltage by a Monochromatic Transmission Electron MicroscopeShigeyuki Morishita, Masaki Mukai, Kazu Suenaga, et al.
FEMS Microbiology Ecology|November 22, 2012
Characterization of 2,4-dichlorophenoxyacetic acid and 2,4,5-trichlorophenoxyacetic acid-degrading fungi in Vietnamese soilsKazuhito Itoh, Masahiro Kinoshita, Shigeyuki Morishita, et al.
Microscopy (Oxford, England)|September 12, 2022
Spatial and phase resolution in electron microscopyRyo Ishikawa, Shigeyuki Morishita, Toshiaki Tanigaki, et al.
Microscopy (Oxford, England)|February 24, 2018
Evaluation of residual aberration in fifth-order geometrical aberration correctorsShigeyuki Morishita, Yuji Kohno, Fumio Hosokawa, et al.
Nature|August 14, 2019
Position and momentum mapping of vibrations in graphene nanostructuresRyosuke Senga, Kazu Suenaga, Paolo Barone, et al.
Microscopy (Oxford, England)|January 9, 2018
Attainment of 40.5 pm spatial resolution using 300 kV scanning transmission electron microscope equipped with fifth-order aberration correctorShigeyuki Morishita, Ryo Ishikawa, Yuji Kohno, et al.
Pageof 2