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Shuiquan Pang

Showing results (1-10 of 5) with videos related to

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The Review of Scientific Instruments|June 3, 2019
A magnification-continuous calibration method for SEM-based nanorobotic manipulation systemsShuiquan Pang, Xianmin Zhang, Xiang Zhang, et al.
Applied Optics|June 18, 2021
Robust block-matching algorithm for motion estimation using an anti-interference similarity criterion and the bilateral optimization schemeShuiquan Pang, Xianmin Zhang, Hai Li, et al.
The Review of Scientific Instruments|April 6, 2021
A robust edge-based template matching algorithm for displacement measurement of compliant mechanisms under scanning electron microscopeYihua Lu, Xianmin Zhang, Shuiquan Pang, et al.
Optics Express|March 17, 2021
Motion measurement system of compliant mechanisms using computer micro-visionSheng Yao, Hai Li, Shuiquan Pang, et al.
The Review of Scientific Instruments|December 1, 2023
An enhanced visualization image acquisition method for samples with poor conductivity under a conventional scanning electron microscopeShuiquan Pang, Hao Xia, Xianmin Zhang, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
The Review of Scientific Instruments|June 3, 2019
A magnification-continuous calibration method for SEM-based nanorobotic manipulation systemsShuiquan Pang, Xianmin Zhang, Xiang Zhang, et al.
Applied Optics|June 18, 2021
Robust block-matching algorithm for motion estimation using an anti-interference similarity criterion and the bilateral optimization schemeShuiquan Pang, Xianmin Zhang, Hai Li, et al.
The Review of Scientific Instruments|April 6, 2021
A robust edge-based template matching algorithm for displacement measurement of compliant mechanisms under scanning electron microscopeYihua Lu, Xianmin Zhang, Shuiquan Pang, et al.
Optics Express|March 17, 2021
Motion measurement system of compliant mechanisms using computer micro-visionSheng Yao, Hai Li, Shuiquan Pang, et al.
The Review of Scientific Instruments|December 1, 2023
An enhanced visualization image acquisition method for samples with poor conductivity under a conventional scanning electron microscopeShuiquan Pang, Hao Xia, Xianmin Zhang, et al.
Pageof 1