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Sensors (Basel, Switzerland)|November 27, 2024
Implementation of an Image Tampering Detection System with a CMOS Image Sensor PUF and OP-TEETatsuya Oyama, Manami Hagizaki, Shunsuke Okura, et al.Sensors (Basel, Switzerland)|July 11, 2023
Backdoor Attack on Deep Neural Networks Triggered by Fault Injection Attack on Image Sensor InterfaceTatsuya Oyama, Shunsuke Okura, Kota Yoshida, et al.Sensors (Basel, Switzerland)|December 22, 2019
A 120-ke<sup>-</sup> Full-Well Capacity 160-µV/e<sup>-</sup> Conversion Gain 2.8-µm Backside-Illuminated Pixel with a Lateral Overflow Integration CapacitorIsao Takayanagi, Ken Miyauchi, Shunsuke Okura, et al.Sensors (Basel, Switzerland)|February 13, 2026
Compression-Efficient Feature Extraction Method for a CMOS Image SensorKeiichiro Kuroda, Yu Osuka, Ryoya Iegaki, et al.Sensors (Basel, Switzerland)|May 13, 2023
An Area-Efficient up/down Double-Sampling Circuit for a LOFIC CMOS Image SensorAi Otani, Hiroaki Ogawa, Ken Miyauchi, et al.Sensors (Basel, Switzerland)|October 16, 2025
An Area-Efficient Readout Circuit for a High-SNR Triple-Gain LOFIC CMOS Image SensorAi Otani, Hiroaki Ogawa, Ken Miyauchi, et al.Sensors (Basel, Switzerland)|September 28, 2021
Area-Efficient Post-Processing Circuits for Physically Unclonable Function with 2-Mpixel CMOS Image SensorShunsuke Okura, Masanori Aoki, Tatsuya Oyama, et al.Sensors (Basel, Switzerland)|January 13, 2018
An Over 90 dB Intra-Scene Single-Exposure Dynamic Range CMOS Image Sensor Using a 3.0 μm Triple-Gain Pixel Fabricated in a Standard BSI ProcessIsao Takayanagi, Norio Yoshimura, Kazuya Mori, et al.Pageof 1