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Plos One|May 21, 2015
Quantitative localization microscopy: effects of photophysics and labeling stoichiometryRobert P J Nieuwenhuizen, Mark Bates, Anna Szymborska, et al.Ultramicroscopy|July 12, 2011
A fast algorithm for computing and correcting the CTF for tilted, thick specimens in TEMLenard M Voortman, Sjoerd Stallinga, Remco H M Schoenmakers, et al.Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|April 12, 2006
Energy and momentum of light in dielectric mediaSjoerd StallingaOptics Express|June 9, 2009
Radiation force on a Fabry-Perot slab immersed in a dielectricSjoerd StallingaJournal of the Optical Society of America. A, Optics, Image Science, and Vision|September 24, 2004
Light distribution close to focus in biaxially birefringent mediaSjoerd StallingaJournal of the Optical Society of America. A, Optics, Image Science, and Vision|September 15, 2015
Effect of rotational diffusion in an orientational potential well on the point spread function of electric dipole emittersSjoerd StallingaPlos One|July 11, 2015
Co-Orientation: Quantifying Simultaneous Co-Localization and Orientational Alignment of Filaments in Light MicroscopyRobert P J Nieuwenhuizen, Leila Nahidiazar, Erik M M Manders, et al.Journal of the Optical Society of America. A, Optics, Image Science, and Vision|December 18, 2004
Strehl ratio for focusing into biaxially birefringent mediaSjoerd StallingaApplied Optics|December 16, 2005
Finite conjugate spherical aberration compensation in high numerical-aperture optical disc readoutSjoerd StallingaApplied Optics|March 9, 2005
Compact description of substrate-related aberrations in high numerical-aperture optical disk readoutSjoerd StallingaPageof 10