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Applied Optics|November 22, 2021
Correction of PZT scanner errors using a phase compensation method in white-light phase-shifting interferometryNamyoon Kim, Soonyang KwonOptics Express|August 5, 2014
Critical dimension measurement of transparent film layers by multispectral imagingSoonyang Kwon, Namyoon Kim, Taeyong Jo, et al.Light, Science & Applications|February 8, 2022
Microsphere-assisted, nanospot, non-destructive metrology for semiconductor devicesSoonyang Kwon, Jangryul Park, Kwangrak Kim, et al.Microsystems & Nanoengineering|October 10, 2023
Snapshot Mueller spectropolarimeter imagerTianxiang Dai, Thaibao Phan, Evan W Wang, et al.Light, Science & Applications|May 28, 2024
Microsphere-assisted hyperspectral imaging: super-resolution, non-destructive metrology for semiconductor devicesJangryul Park, Youngsun Choi, Soonyang Kwon, et al.Pageof 1