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UV–Vis Spectrometers

UV–Vis Spectrometers

The absorbance of UV and visible (UV–visible) radiations is measured using a UV–visible spectrophotometer. Deuterium lamps, which emit UV radiation, and tungsten lamps, which produce radiation in the visible region, are used as light sources in UV–visible spectrophotometers. A monochromator or prism is used for diffraction grating, i.e., to split the incoming radiation into different wavelengths. A system of slits is used to focus the desired wavelength on the sample cell.

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Related Experiment Video

Updated: Jul 14, 2025

Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures

Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures

Published on: November 21, 2019

Snapshot Mueller spectropolarimeter imager.

Tianxiang Dai¹, Thaibao Phan¹, Evan W Wang¹

¹Department of Electrical Engineering, Stanford University, Stanford, CA 94305 USA.

Microsystems & Nanoengineering

|October 10, 2023

Summary

This summary is machine-generated.

This study presents a novel imaging system for simultaneous Mueller polarization and wavelength measurements. This technology enables precise thin film thickness mapping for advanced optical metrology applications.

Keywords:

Micro-optics Nanophotonics and plasmonics Optical sensors

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Area of Science:

Optics and Photonics
Materials Science
Computational Imaging

Background:

Accurate polarization and wavelength measurements are crucial for material characterization and optical metrology.
Existing imaging systems often require multiple captures or complex setups, limiting real-time analysis.
Simultaneous acquisition of polarization and spectral information presents a significant challenge in optical imaging.

Purpose of the Study:

To develop an advanced imaging system capable of simultaneously capturing complete Mueller polarization responses across multiple wavelength channels in a single image acquisition.
To demonstrate a real-time calibration method for this novel imaging system using a customized neural network.
To validate the system's performance by accurately reconstructing a thin film thickness map.

Main Methods:

Implementation of a division-of-focal-plane concept integrating multiplexed Fourier optics and a telescopic light-field imaging system.
Utilization of broadband nanostructured plasmonic polarizers as functional pinhole apertures for polarization-resolved imaging.
Development and application of a neural network-based calibration approach for real-time data processing.

Main Results:

Successful simultaneous recording of complete Mueller polarization responses and wavelength channels in a single image capture.
Highly interpretable polarization and wavelength information directly recorded on the image sensor.
Accurate reconstruction of a thin film thickness map from a four-inch wafer using the calibrated system.

Conclusions:

The developed imaging system offers a significant advancement in simultaneous polarization and spectral imaging.
The real-time calibration method enhances the system's practical applicability in metrology and machine vision.
This technology holds potential for diverse applications in metrology, machine vision, computational imaging, and optical computing.