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ACS Applied Materials & Interfaces|July 28, 2018
Combining TEM, AFM, and Profilometry for Quantitative Topography Characterization Across All ScalesAbhijeet Gujrati, Subarna R Khanal, Lars Pastewka, et al.
Nanotechnology|November 17, 2018
Understanding contact between platinum nanocontacts at low loads: The effect of reversible plasticitySai Bharadwaj Vishnubhotla, Rimei Chen, Subarna R Khanal, et al.
Proceedings of the National Academy of Sciences of the United States of America|November 28, 2019
Linking energy loss in soft adhesion to surface roughnessSiddhesh Dalvi, Abhijeet Gujrati, Subarna R Khanal, et al.
Nanotechnology|November 28, 2018
Quantitative measurement of contact area and electron transport across platinum nanocontacts for scanning probe microscopy and electrical nanodevicesSai Bharadwaj Vishnubhotla, Rimei Chen, Subarna R Khanal, et al.
ACS Nano|October 31, 2017
Sub-10 Nanometer Feature Size in Silicon Using Thermal Scanning Probe LithographyYu Kyoung Ryu Cho, Colin D Rawlings, Heiko Wolf, et al.
The Review of Scientific Instruments|December 4, 2018
A simple atomic force microscope-based method for quantifying wear of sliding probesErin E Flater, Jared D Barnes, Jesse A Hitz Graff, et al.
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