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T A Henry

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Optics Express|January 18, 2013
Quantitative and depth-resolved deep level defect distributions in InGaN/GaN light emitting diodesA Armstrong, T A Henry, D D Koleske, et al.
Optics Express|November 29, 2012
Quantitative and depth-resolved deep level defect distributions in InGaN/GaN light emitting diodesA Armstrong, T A Henry, D D Koleske, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Optics Express|January 18, 2013
Quantitative and depth-resolved deep level defect distributions in InGaN/GaN light emitting diodesA Armstrong, T A Henry, D D Koleske, et al.
Optics Express|November 29, 2012
Quantitative and depth-resolved deep level defect distributions in InGaN/GaN light emitting diodesA Armstrong, T A Henry, D D Koleske, et al.
Pageof 1