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Micron (Oxford, England : 1993)|February 28, 2006
EELS study of niobium carbo-nitride nano-precipitates in ferriteE Courtois, T Epicier, C ScottMicron (Oxford, England : 1993)|February 16, 2013
Chemical 3D tomography of 28nm high K metal gate transistor: STEM XEDS experimental method and resultsK Lepinay, F Lorut, R Pantel, et al.Ultramicroscopy|July 15, 2021
Accurate post-mortem alignment for Focused Ion Beam and Scanning Electron Microscopy (FIB-SEM) tomographyH Yuan, B Van de Moortèle, T EpicierUltramicroscopy|January 31, 2006
Polarization dependence in ELNES: influence of probe convergence, collector aperture and electron beam incidence angleJ C Le Bossé, T Epicier, B JouffreyNano Letters|November 23, 2017
Direct Visualization and Control of Atomic Mobility at {100} Surfaces of Ceria in the Environmental Transmission Electron MicroscopeM Bugnet, S H Overbury, Z L Wu, et al.Journal of Microscopy|November 20, 2008
Characterization of precipitates size distribution: validation of low-voltage STEMD Acevedo-Reyes, M Perez, C Verdu, et al.Journal of Microscopy|January 25, 2017
HAADF-STEM characterization and simulation of nanoparticle distributions in an inhomogeneous matrixZ Liu, T Epicier, Y Lefkir, et al.Journal of Microscopy|April 16, 2003
N-K ELNES study of anisotropy effects in hexagonal AlNG Radtke, T Epicier, P Bayle-Guillemaud, et al.Physical Review Letters|February 19, 2013
Multi-L1(0) domain CoPt and FePt nanoparticles revealed by electron microscopyF Tournus, K Sato, T Epicier, et al.Journal of Microscopy|April 11, 2017
Fast 'Operando' electron nanotomographyL Roiban, S Li, M Aouine, et al.Pageof 2