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T Hantschel

Showing results (1-10 of 6) with videos related to

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Ultramicroscopy|December 2, 2015
Outwitting the series resistance in scanning spreading resistance microscopyA Schulze, R Cao, P Eyben, et al.
Nanotechnology|July 12, 2012
Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnectsA Schulze, T Hantschel, A Dathe, et al.
Ultramicroscopy|January 1, 2013
Quantitative three-dimensional carrier mapping in nanowire-based transistors using scanning spreading resistance microscopyA Schulze, T Hantschel, P Eyben, et al.
Nanotechnology|December 17, 2009
Optimization of multi-walled carbon nanotube-metal contacts by electrical stressingP M Ryan, A S Verhulst, D Cott, et al.
Nanotechnology|March 8, 2013
Carbon nanotube growth for through silicon via applicationR Xie, C Zhang, M H van der Veen, et al.
Nanotechnology|March 19, 2011
Observation of diameter dependent carrier distribution in nanowire-based transistorsA Schulze, T Hantschel, P Eyben, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|December 2, 2015
Outwitting the series resistance in scanning spreading resistance microscopyA Schulze, R Cao, P Eyben, et al.
Nanotechnology|July 12, 2012
Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnectsA Schulze, T Hantschel, A Dathe, et al.
Ultramicroscopy|January 1, 2013
Quantitative three-dimensional carrier mapping in nanowire-based transistors using scanning spreading resistance microscopyA Schulze, T Hantschel, P Eyben, et al.
Nanotechnology|December 17, 2009
Optimization of multi-walled carbon nanotube-metal contacts by electrical stressingP M Ryan, A S Verhulst, D Cott, et al.
Nanotechnology|March 8, 2013
Carbon nanotube growth for through silicon via applicationR Xie, C Zhang, M H van der Veen, et al.
Nanotechnology|March 19, 2011
Observation of diameter dependent carrier distribution in nanowire-based transistorsA Schulze, T Hantschel, P Eyben, et al.
Pageof 1