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Ultramicroscopy|January 8, 2013
Analysis of implanted silicon dopant profilesT J Prosa, D Olson, B Geiser, et al.Ultramicroscopy|January 11, 2011
Effect of analysis direction on the measurement of interfacial mixing in thin metal layers with atom probe tomographyD J Larson, T J Prosa, B P Geiser, et al.Journal of Microscopy|December 2, 2010
Evolution of tip shape during field evaporation of complex multilayer structuresE A Marquis, B P Geiser, T J Prosa, et al.Journal of Microscopy|August 22, 2012
Focused ion beam fabrication of solidified ferritin into nanoscale volumes for compositional analysis using atom probe tomographyM E Greene, T F Kelly, D J Larson, et al.Nature Communications|May 27, 2017
Atomic-scale age resolution of planetary eventsL F White, J R Darling, D E Moser, et al.Journal of Microscopy|December 16, 2010
Improvements in planar feature reconstructions in atom probe tomographyD J Larson, B P Geiser, T J Prosa, et al.Journal of the American Veterinary Medical Association|March 15, 1980
Mild transmissible gastroenteritis in pigs suckling vaccinated sowsD J Larson, R F Solorzano, L G Morehouse, et al.Journal of Microscopy|January 26, 2010
Atom probe tomography analysis of poly(3-alkylthiophene)sT J Prosa, S Kostrna Keeney, T F KellyUltramicroscopy|August 30, 2006
In situ site-specific specimen preparation for atom probe tomographyK Thompson, D Lawrence, D J Larson, et al.Journal of Microscopy|July 16, 2010
Characterization of dilute species within CVD-grown silicon nanowires doped using trimethylboron: protected lift-out specimen preparation for atom probe tomographyT J Prosa, R Alvis, L Tsakalakos, et al.Pageof 155