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Journal of Electron Microscopy Technique|February 1, 1988
EELS log-ratio technique for specimen-thickness measurement in the TEMT Malis, S C Cheng, R F EgertonUltramicroscopy|January 1, 1978
Formulae for light-element microanalysis by electron energy-loss spectrometryR F EgertonMicroscopy (Oxford, England)|November 15, 2017
Calculation, consequences and measurement of the point spread function for low-loss inelastic scatteringR F EgertonUltramicroscopy|January 30, 2007
Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopyR F EgertonMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 22, 2013
Beam-induced motion of adatoms in the transmission electron microscopeR F EgertonMicron (Oxford, England : 1993)|December 19, 2023
Voxel dose-limited resolution for thick beam-sensitive specimens imaged in a TEM or STEMR F EgertonMicron (Oxford, England : 1993)|August 5, 2003
New techniques in electron energy-loss spectroscopy and energy-filtered imagingR F EgertonPageof 18