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Journal of Electron Microscopy Technique|February 1, 1988
EELS log-ratio technique for specimen-thickness measurement in the TEMT Malis, S C Cheng, R F Egerton
Ultramicroscopy|August 3, 2021
Dose measurement in the TEM and STEMR F Egerton
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 22, 2013
Beam-induced motion of adatoms in the transmission electron microscopeR F Egerton
Ultramicroscopy|January 7, 2012
TEM-EELS: a personal perspectiveR F Egerton
Ultramicroscopy|April 6, 2017
Scattering delocalization and radiation damage in STEM-EELSR F Egerton
Micron (Oxford, England : 1993)|December 19, 2023
Voxel dose-limited resolution for thick beam-sensitive specimens imaged in a TEM or STEMR F Egerton
Micron (Oxford, England : 1993)|August 5, 2003
New techniques in electron energy-loss spectroscopy and energy-filtered imagingR F Egerton
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