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Related Experiment Videos

Scattering delocalization and radiation damage in STEM-EELS.

R F Egerton1

  • 1Physics Department, University of Alberta, Edmonton T6G 2E1, Canada.

Ultramicroscopy
|April 6, 2017
PubMed
Summary
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Electron scattering delocalization in thin specimens is analyzed for low energy losses. This research explains polymer damage kinetics and proposes a novel imaging technique for beam-sensitive materials.

Area of Science:

  • Electron Microscopy and Spectroscopy
  • Materials Science
  • Radiation Damage Physics

Background:

  • Inelastic electron scattering in thin specimens exhibits delocalization effects when energy losses are low (<50 eV).
  • The delocalization length can exceed atomic dimensions, impacting spatial resolution in electron microscopy.
  • Understanding scattering delocalization is crucial for interpreting damage mechanisms in beam-sensitive materials like polymers.

Purpose of the Study:

  • To derive analytical expressions for the point spread function (PSF) characterizing inelastic electron scattering delocalization.
  • To compute a PSF for energy deposition and relate it to radiolysis damage.
  • To explain observed damage kinetics in polymers and evaluate a new imaging technique.

Main Methods:

Keywords:
DelocalizationEELSInelastic scatteringRadiation damageSTEMTEM

Related Experiment Videos

  • Derivation of analytical expressions for the point spread function (PSF) based on angular distribution and dielectric energy loss models.
  • Computation of a PSF for energy deposition.
  • Experimental measurement of damage kinetics as a function of probe diameter in polymers.
  • Evaluation of a 'leapfrog' coarse-scanning procedure for imaging.

    • Main Results:

    • Analytical expressions for the PSF describing radial scattering distribution were derived.
    • A PSF for energy deposition was computed, correlating with radiolysis damage.
    • The derived concepts successfully explained damage kinetics in various polymers as a function of probe diameter.
    • The 'leapfrog' scanning procedure was evaluated as a viable technique for energy-filtered imaging.

    Conclusions:

    • Delocalization of inelastic electron scattering significantly influences spatial resolution and damage in thin specimens.
    • The developed PSF models provide a framework for understanding and quantifying electron scattering and energy deposition.
    • The study offers insights into polymer radiolysis and introduces a promising imaging strategy for sensitive materials.