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Ultramicroscopy|April 1, 2014
Choice of operating voltage for a transmission electron microscopeR F EgertonMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 20, 2014
Prospects for vibrational-mode EELS with high spatial resolutionR F EgertonMicron (Oxford, England : 1993)|April 6, 2025
Two- and three-dimensional electron imaging of beam-sensitive specimensR F EgertonMicroscopy Research and Technique|July 19, 2012
Mechanisms of radiation damage in beam-sensitive specimens, for TEM accelerating voltages between 10 and 300 kVR F EgertonMicron (Oxford, England : 1993)|January 27, 2019
Radiation damage to organic and inorganic specimens in the TEMR F EgertonUltramicroscopy|September 5, 2015
Vibrational-loss EELS and the avoidance of radiation damageR F EgertonUltramicroscopy|January 1, 1984
Assessment of electron irradiation damage to biomolecules by electron diffraction and electron energy-loss spectroscopyM Misra, R F EgertonMicron (Oxford, England : 1993)|June 15, 2022
Spatial resolution in transmission electron microscopyR F Egerton, M WatanabeUltramicroscopy|July 6, 2018
Characterization of single-atom catalysts by EELS and EDX spectroscopyR F Egerton, M WatanabePageof 18