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Taleana Huff

Showing results (1-10 of 7) with videos related to

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Beilstein Journal of Nanotechnology|September 25, 2020
Atomic defect classification of the H-Si(100) surface through multi-mode scanning probe microscopyJeremiah Croshaw, Thomas Dienel, Taleana Huff, et al.
Nature Communications|February 15, 2017
Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surfaceHatem Labidi, Mohammad Koleini, Taleana Huff, et al.
Nanoscale|February 3, 2021
Ionic charge distributions in silicon atomic surface wiresJeremiah Croshaw, Taleana Huff, Mohammad Rashidi, et al.
Physical Review Letters|November 3, 2018
Initiating and Monitoring the Evolution of Single Electrons Within Atom-Defined StructuresMohammad Rashidi, Wyatt Vine, Thomas Dienel, et al.
Ultramicroscopy|June 29, 2015
New fabrication technique for highly sensitive qPlus sensor with well-defined spring constantHatem Labidi, Martin Kupsta, Taleana Huff, et al.
Nature Communications|July 25, 2018
Lithography for robust and editable atomic-scale silicon devices and memoriesRoshan Achal, Mohammad Rashidi, Jeremiah Croshaw, et al.
ACS Nano|February 20, 2024
Atomically Precise Manufacturing of Silicon ElectronicsJason Pitters, Jeremiah Croshaw, Roshan Achal, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Beilstein Journal of Nanotechnology|September 25, 2020
Atomic defect classification of the H-Si(100) surface through multi-mode scanning probe microscopyJeremiah Croshaw, Thomas Dienel, Taleana Huff, et al.
Nature Communications|February 15, 2017
Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surfaceHatem Labidi, Mohammad Koleini, Taleana Huff, et al.
Nanoscale|February 3, 2021
Ionic charge distributions in silicon atomic surface wiresJeremiah Croshaw, Taleana Huff, Mohammad Rashidi, et al.
Physical Review Letters|November 3, 2018
Initiating and Monitoring the Evolution of Single Electrons Within Atom-Defined StructuresMohammad Rashidi, Wyatt Vine, Thomas Dienel, et al.
Ultramicroscopy|June 29, 2015
New fabrication technique for highly sensitive qPlus sensor with well-defined spring constantHatem Labidi, Martin Kupsta, Taleana Huff, et al.
Nature Communications|July 25, 2018
Lithography for robust and editable atomic-scale silicon devices and memoriesRoshan Achal, Mohammad Rashidi, Jeremiah Croshaw, et al.
ACS Nano|February 20, 2024
Atomically Precise Manufacturing of Silicon ElectronicsJason Pitters, Jeremiah Croshaw, Roshan Achal, et al.
Pageof 1