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Ultramicroscopy|June 13, 2003
Calibration and examination of piezoresistive Wheatstone bridge cantilevers for scanning probe microscopyTeodor Gotszalk, Piotr Grabiec, Ivo W Rangelow
Ultramicroscopy|August 13, 2013
Thermal mapping of a scanning thermal microscopy tipGrzegorz Jóźwiak, Grzegorz Wielgoszewski, Teodor Gotszalk, et al.
The Review of Scientific Instruments|May 3, 2018
Metrological 2iOF fibre-optic system for position and displacement measurement with 31 pm resolutionKarolina Orłowska, Michał Świątkowski, Piotr Kunicki, et al.
Applied Optics|August 10, 2016
High-resolution and wide-bandwidth light intensity fiber optic displacement sensor for MEMS metrologyKarolina Orłowska, Michał Świątkowski, Piotr Kunicki, et al.
Ultramicroscopy|August 13, 2018
Multifrequency Kelvin probe force microscopy on self assembled molecular layers and quantitative assessment of images' qualityDaniel Kopiec, Grzegorz Jóźwiak, Magdalena Moczała, et al.
Sensors (Basel, Switzerland)|October 17, 2019
Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam ProcessingPiotr Kunicki, Tihomir Angelov, Tzvetan Ivanov, et al.
Nanotechnology|December 8, 2023
Electrical, thermal and noise properties of platinum-carbon free-standing nanowires designed as nanoscale resistive thermal devicesTomasz Piasecki, Krzysztof Kwoka, Ewelina Gacka, et al.
Ultramicroscopy|December 15, 2020
Active calibration reference of minimized height for characterization of scanning thermal microscopy systemsPaweł Janus, Dariusz Szmigiel, Andrzej Sierakowski, et al.
The Review of Scientific Instruments|June 2, 2014
Atmospheric pressure plasma jet with high-voltage power supply based on piezoelectric transformerMichał Babij, Zbigniew W Kowalski, Karol Nitsch, et al.
Ultramicroscopy|April 24, 2010
Tunneling/shear force microscopy using piezoelectric tuning forks for characterization of topography and local electric surface propertiesMirosław Woszczyna, Paweł Zawierucha, Agata Masalska, et al.
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