Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Tielin Shi

Showing results (1-10 of 75) with videos related to

Pageof 8
Sort By:
Sensors (Basel, Switzerland)|April 26, 2025
An Innovative Study for Tool Wear Prediction Based on Stacked Sparse Autoencoder and Ensemble Learning StrategyZhaopeng He, Tielin Shi, Xu Chen
The Review of Scientific Instruments|January 10, 2012
A method for fine positioning of diagnostic packages in inertial confinement fusion experimentsWei Wang, Tielin Shi, Kok-Meng Lee
Journal of Nanoscience and Nanotechnology|February 17, 2018
Cost-Effective Fabrication of Inner-Porous Micro/Nano Carbon StructuresShulan Jiang, Tielin Shi, Zirong Tang, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|November 4, 2009
Improved model-based infrared reflectrometry for measuring deep trench structuresChuanwei Zhang, Shiyuan Liu, Tielin Shi, et al.
Journal of Nanoscience and Nanotechnology|July 26, 2013
Controlled fabrication of silicon nanowires via nanosphere lithograph and metal assisted chemical etchingBo Sun, Tielin Shi, Wenjun Sheng, et al.
Journal of Nanoscience and Nanotechnology|April 18, 2014
A novel method to fabricate silicon tubular gratings with broadband antireflection and super-hydrophobicityYang Gao, Tielin Shi, Xianhua Tan, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|February 5, 2011
Fitting-determined formulation of effective medium approximation for 3D trench structures in model-based infrared reflectrometryChuanwei Zhang, Shiyuan Liu, Tielin Shi, et al.
Optics Express|October 14, 2010
Generalized formulations for aerial image based lens aberration metrology in lithographic tools with arbitrarily shaped illumination sourcesWei Liu, Shiyuan Liu, Tielin Shi, et al.
Journal of Nanoscience and Nanotechnology|December 9, 2010
Combined AFM nano-machining and reactive ion etching to fabricate high aspect ratio structuresPing Peng, Tielin Shi, Guanglan Liao, et al.
IEEE Transactions on Neural Networks and Learning Systems|March 4, 2025
A Fast Graph Construction-Driven Rotating Machine Fault Diagnosis Method Using Edge PredictorChaoying Yang, Jie Liu, Yue Wang, et al.
Pageof 8

Showing results (1-10 of 75) with videos related to

Sort By:
Pageof 8
Sensors (Basel, Switzerland)|April 26, 2025
An Innovative Study for Tool Wear Prediction Based on Stacked Sparse Autoencoder and Ensemble Learning StrategyZhaopeng He, Tielin Shi, Xu Chen
The Review of Scientific Instruments|January 10, 2012
A method for fine positioning of diagnostic packages in inertial confinement fusion experimentsWei Wang, Tielin Shi, Kok-Meng Lee
Journal of Nanoscience and Nanotechnology|February 17, 2018
Cost-Effective Fabrication of Inner-Porous Micro/Nano Carbon StructuresShulan Jiang, Tielin Shi, Zirong Tang, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|November 4, 2009
Improved model-based infrared reflectrometry for measuring deep trench structuresChuanwei Zhang, Shiyuan Liu, Tielin Shi, et al.
Journal of Nanoscience and Nanotechnology|July 26, 2013
Controlled fabrication of silicon nanowires via nanosphere lithograph and metal assisted chemical etchingBo Sun, Tielin Shi, Wenjun Sheng, et al.
Journal of Nanoscience and Nanotechnology|April 18, 2014
A novel method to fabricate silicon tubular gratings with broadband antireflection and super-hydrophobicityYang Gao, Tielin Shi, Xianhua Tan, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|February 5, 2011
Fitting-determined formulation of effective medium approximation for 3D trench structures in model-based infrared reflectrometryChuanwei Zhang, Shiyuan Liu, Tielin Shi, et al.
Optics Express|October 14, 2010
Generalized formulations for aerial image based lens aberration metrology in lithographic tools with arbitrarily shaped illumination sourcesWei Liu, Shiyuan Liu, Tielin Shi, et al.
Journal of Nanoscience and Nanotechnology|December 9, 2010
Combined AFM nano-machining and reactive ion etching to fabricate high aspect ratio structuresPing Peng, Tielin Shi, Guanglan Liao, et al.
IEEE Transactions on Neural Networks and Learning Systems|March 4, 2025
A Fast Graph Construction-Driven Rotating Machine Fault Diagnosis Method Using Edge PredictorChaoying Yang, Jie Liu, Yue Wang, et al.
Pageof 8