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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 1, 2024
Obtaining 3D Atomic Reconstructions from Electron Microscopy Images Using a Bayesian Genetic Algorithm: Possibilities, Insights, and LimitationsTom Stoops, Annick De Backer, Ivan Lobato, et al.
Ultramicroscopy|October 2, 2021
Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tiltAnnelies De Wael, Annick De Backer, Ivan Lobato, et al.
Ultramicroscopy|January 9, 2023
Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditionsZezhong Zhang, Ivan Lobato, Annick De Backer, et al.
Ultramicroscopy|October 22, 2020
Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitationsAnnelies De Wael, Annick De Backer, Sandra Van Aert
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 19, 2022
Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEMAnnelies De Wael, Annick De Backer, Chu-Ping Yu, et al.
Nanoscale|January 12, 2021
Three-dimensional atomic structure of supported Au nanoparticles at high temperaturePei Liu, Ece Arslan Irmak, Annick De Backer, et al.
Ultramicroscopy|November 10, 2024
Towards atom counting from first moment STEM images: Methodology and possibilitiesYansong Hao, Annick De Backer, Scott David Findlay, et al.
Ultramicroscopy|March 16, 2017
Hybrid statistics-simulations based method for atom-counting from ADF STEM imagesAnnelies De Wael, Annick De Backer, Lewys Jones, et al.
Ultramicroscopy|November 15, 2025
Secondary electron topographical contrast formation in scanning transmission electron microscopyEvgenii Vlasov, Wouter Heyvaert, Tom Stoops, et al.
Physical Review Letters|March 29, 2020
Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron MicroscopyAnnelies De Wael, Annick De Backer, Lewys Jones, et al.
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