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Tom Wirtz

Showing results (1-10 of 45) with videos related to

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Beilstein Journal of Nanotechnology|July 15, 2015
High sensitivity and high resolution element 3D analysis by a combined SIMS-SPM instrumentYves Fleming, Tom Wirtz
Analytical Chemistry|June 22, 2012
Reduction of matrix effects in polystyrene/poly(methylene methacrylate) blends by metal-assisted secondary ion mass spectrometryNora Becker, Tom Wirtz
Beilstein Journal of Nanotechnology|February 2, 2017
Nanoanalytics for materials scienceThilo Glatzel, Tom Wirtz
Analytical Chemistry|September 15, 2018
Correlative Microscopy in 3D: Helium Ion Microscopy-Based Photogrammetric Topography Reconstruction Combined with in situ Secondary Ion Mass SpectrometryFlorian Vollnhals, Tom Wirtz
Beilstein Journal of Nanotechnology|February 2, 2017
Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopyPatrick Philipp, Lukasz Rzeznik, Tom Wirtz
Scientific Reports|June 29, 2016
In-situ Isotopic Analysis at Nanoscale using Parallel Ion Electron Spectrometry: A Powerful New Paradigm for Correlative MicroscopyLluís Yedra, Santhana Eswara, David Dowsett, et al.
Micron (Oxford, England : 1993)|April 26, 2026
Time-of-flight scanning transmission ion microscopy with high energy resolution in the low keV rangeDustin Andersen, Rathaiah Pureti, Tom Wirtz, et al.
Beilstein Journal of Nanotechnology|August 23, 2016
Experimental and simulation-based investigation of He, Ne and Ar irradiation of polymers for ion microscopyLukasz Rzeznik, Yves Fleming, Tom Wirtz, et al.
Journal of Mass Spectrometry : JMS|March 13, 2014
Mechanisms of silicon sputtering and cluster formation explained by atomic level simulationsPeter R Barry, Patrick Philipp, Tom Wirtz, et al.
Annual Review of Analytical Chemistry (Palo Alto, Calif.)|January 31, 2019
Imaging and Analytics on the Helium Ion MicroscopeTom Wirtz, Olivier De Castro, Jean-Nicolas Audinot, et al.
Pageof 5

Showing results (1-10 of 45) with videos related to

Sort By:
Pageof 5
Beilstein Journal of Nanotechnology|July 15, 2015
High sensitivity and high resolution element 3D analysis by a combined SIMS-SPM instrumentYves Fleming, Tom Wirtz
Analytical Chemistry|June 22, 2012
Reduction of matrix effects in polystyrene/poly(methylene methacrylate) blends by metal-assisted secondary ion mass spectrometryNora Becker, Tom Wirtz
Beilstein Journal of Nanotechnology|February 2, 2017
Nanoanalytics for materials scienceThilo Glatzel, Tom Wirtz
Analytical Chemistry|September 15, 2018
Correlative Microscopy in 3D: Helium Ion Microscopy-Based Photogrammetric Topography Reconstruction Combined with in situ Secondary Ion Mass SpectrometryFlorian Vollnhals, Tom Wirtz
Beilstein Journal of Nanotechnology|February 2, 2017
Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopyPatrick Philipp, Lukasz Rzeznik, Tom Wirtz
Scientific Reports|June 29, 2016
In-situ Isotopic Analysis at Nanoscale using Parallel Ion Electron Spectrometry: A Powerful New Paradigm for Correlative MicroscopyLluís Yedra, Santhana Eswara, David Dowsett, et al.
Micron (Oxford, England : 1993)|April 26, 2026
Time-of-flight scanning transmission ion microscopy with high energy resolution in the low keV rangeDustin Andersen, Rathaiah Pureti, Tom Wirtz, et al.
Beilstein Journal of Nanotechnology|August 23, 2016
Experimental and simulation-based investigation of He, Ne and Ar irradiation of polymers for ion microscopyLukasz Rzeznik, Yves Fleming, Tom Wirtz, et al.
Journal of Mass Spectrometry : JMS|March 13, 2014
Mechanisms of silicon sputtering and cluster formation explained by atomic level simulationsPeter R Barry, Patrick Philipp, Tom Wirtz, et al.
Annual Review of Analytical Chemistry (Palo Alto, Calif.)|January 31, 2019
Imaging and Analytics on the Helium Ion MicroscopeTom Wirtz, Olivier De Castro, Jean-Nicolas Audinot, et al.
Pageof 5