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W F van Dorp

Showing results (1-10 of 8) with videos related to

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Nanotechnology|August 10, 2011
Growth behavior near the ultimate resolution of nanometer-scale focused electron beam-induced depositionW F van Dorp, C W Hagen, P A Crozier, et al.
Journal of Microscopy|March 23, 2006
Diffraction patterns of artificial two-dimensional crystals synthesized in situ in an environmental scanning transmission electron microscopeW F van Dorp, B van Someren, C W Hagen, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|September 17, 2014
Gold complexes for focused-electron-beam-induced depositionW F van Dorp, X Wu, J J L Mulders, et al.
Nanotechnology|February 9, 2011
Ultrahigh resolution focused electron beam induced processing: the effect of substrate thicknessW F van Dorp, I Lazić, A Beyer, et al.
Nanotechnology|November 24, 2011
Nanometer-scale lithography on microscopically clean grapheneW F van Dorp, X Zhang, B L Feringa, et al.
Ultramicroscopy|November 3, 2017
Si amorphization by focused ion beam milling: Point defect model with dynamic BCA simulation and experimental validationJ Huang, M Loeffler, U Muehle, et al.
Nanotechnology|August 1, 2013
Focused electron beam induced processing and the effect of substrate thickness revisitedW F van Dorp, A Beyer, M Mainka, et al.
Journal of Materials Chemistry. B|April 9, 2020
Selective functionalization of patterned glass surfacesE Ploetz, B Visser, W Slingenbergh, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Nanotechnology|August 10, 2011
Growth behavior near the ultimate resolution of nanometer-scale focused electron beam-induced depositionW F van Dorp, C W Hagen, P A Crozier, et al.
Journal of Microscopy|March 23, 2006
Diffraction patterns of artificial two-dimensional crystals synthesized in situ in an environmental scanning transmission electron microscopeW F van Dorp, B van Someren, C W Hagen, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|September 17, 2014
Gold complexes for focused-electron-beam-induced depositionW F van Dorp, X Wu, J J L Mulders, et al.
Nanotechnology|February 9, 2011
Ultrahigh resolution focused electron beam induced processing: the effect of substrate thicknessW F van Dorp, I Lazić, A Beyer, et al.
Nanotechnology|November 24, 2011
Nanometer-scale lithography on microscopically clean grapheneW F van Dorp, X Zhang, B L Feringa, et al.
Ultramicroscopy|November 3, 2017
Si amorphization by focused ion beam milling: Point defect model with dynamic BCA simulation and experimental validationJ Huang, M Loeffler, U Muehle, et al.
Nanotechnology|August 1, 2013
Focused electron beam induced processing and the effect of substrate thickness revisitedW F van Dorp, A Beyer, M Mainka, et al.
Journal of Materials Chemistry. B|April 9, 2020
Selective functionalization of patterned glass surfacesE Ploetz, B Visser, W Slingenbergh, et al.
Pageof 1