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W Sinkler

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 24, 2009
Sufficient conditions for Direct Methods with swift electronsL D Marks, W Sinkler
Ultramicroscopy|August 30, 2005
Rapid structure determination of a metal oxide from pseudo-kinematical electron diffraction dataC S Own, W Sinkler, L D Marks
Acta Crystallographica. Section A, Foundations of Crystallography|October 24, 2006
Precession electron diffraction 1: multislice simulationC S Own, L D Marks, W Sinkler
Ultramicroscopy|January 9, 2007
Prospects for aberration corrected electron precessionC S Own, W Sinkler, L D Marks
Ultramicroscopy|September 15, 2007
A quantitative analysis of the cone-angle dependence in precession electron diffractionJ Ciston, B Deng, L D Marks, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 24, 2009
Sufficient conditions for Direct Methods with swift electronsL D Marks, W Sinkler
Ultramicroscopy|August 30, 2005
Rapid structure determination of a metal oxide from pseudo-kinematical electron diffraction dataC S Own, W Sinkler, L D Marks
Acta Crystallographica. Section A, Foundations of Crystallography|October 24, 2006
Precession electron diffraction 1: multislice simulationC S Own, L D Marks, W Sinkler
Ultramicroscopy|January 9, 2007
Prospects for aberration corrected electron precessionC S Own, W Sinkler, L D Marks
Ultramicroscopy|September 15, 2007
A quantitative analysis of the cone-angle dependence in precession electron diffractionJ Ciston, B Deng, L D Marks, et al.
Pageof 1