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Optics Express|June 11, 2024
Incoherent partial superposition modeling for single-shot angle-resolved ellipsometry measurement of thin films on transparent substratesLihua Peng, Jian Wang, Feng Gao, et al.Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|June 9, 2021
Recent Progress on Wear-Resistant Materials: Designs, Properties, and ApplicationsWenzheng Zhai, Lichun Bai, Runhua Zhou, et al.Pageof 1