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Won Chegal

Showing results (1-10 of 24) with videos related to

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Optics Express|November 23, 2021
Measurement uncertainty evaluation procedures and applications for various types of multichannel rotating-element spectroscopic ellipsometersYong Jai Cho, Won Chegal
Optics Letters|January 26, 2011
Fourier analysis for rotating-element ellipsometersYong Jai Cho, Won Chegal, Hyun Mo Cho
Optics Express|February 7, 2018
Interferometric snapshot spectro-ellipsometryVamara Dembele, Moonseob Jin, Inho Choi, et al.
Optics Letters|December 11, 2013
Calibration of a snapshot phase-resolved polarization-sensitive spectral reflectometerDaesuk Kim, Moonseob Jin, Won Chegal, et al.
Optics Express|March 14, 2013
Complex object wave direct extraction method in off-axis digital holographyDaesuk Kim, Robert Magnusson, Moonseob Jin, et al.
Optics Express|July 21, 2015
Universal evaluations and expressions of measuring uncertainty for rotating-element spectroscopic ellipsometersYong Jai Cho, Won Chegal, Jeong Pyo Lee, et al.
Optics Express|November 19, 2016
Universal evaluation of combined standard uncertainty for rotating-element spectroscopic ellipsometersYong Jai Cho, Won Chegal, Jeong Pyo Lee, et al.
Light, Science & Applications|August 26, 2025
Single-gate electro-optic beam switching metasurfacesSangjun Han, Jinseok Kong, Junho Choi, et al.
Scientific Reports|November 27, 2025
Rotating compensator spectroscopic ellipsometry based on frequency division multiplexing with retardation calibrationJongkyoon Park, Alexander Gliserin, Sukhyun Choi, et al.
Biophysical Journal|April 6, 2011
Study of cell-matrix adhesion dynamics using surface plasmon resonance imaging ellipsometrySe-Hwa Kim, Won Chegal, Junsang Doh, et al.
Pageof 3

Showing results (1-10 of 24) with videos related to

Sort By:
Pageof 3
Optics Express|November 23, 2021
Measurement uncertainty evaluation procedures and applications for various types of multichannel rotating-element spectroscopic ellipsometersYong Jai Cho, Won Chegal
Optics Letters|January 26, 2011
Fourier analysis for rotating-element ellipsometersYong Jai Cho, Won Chegal, Hyun Mo Cho
Optics Express|February 7, 2018
Interferometric snapshot spectro-ellipsometryVamara Dembele, Moonseob Jin, Inho Choi, et al.
Optics Letters|December 11, 2013
Calibration of a snapshot phase-resolved polarization-sensitive spectral reflectometerDaesuk Kim, Moonseob Jin, Won Chegal, et al.
Optics Express|March 14, 2013
Complex object wave direct extraction method in off-axis digital holographyDaesuk Kim, Robert Magnusson, Moonseob Jin, et al.
Optics Express|July 21, 2015
Universal evaluations and expressions of measuring uncertainty for rotating-element spectroscopic ellipsometersYong Jai Cho, Won Chegal, Jeong Pyo Lee, et al.
Optics Express|November 19, 2016
Universal evaluation of combined standard uncertainty for rotating-element spectroscopic ellipsometersYong Jai Cho, Won Chegal, Jeong Pyo Lee, et al.
Light, Science & Applications|August 26, 2025
Single-gate electro-optic beam switching metasurfacesSangjun Han, Jinseok Kong, Junho Choi, et al.
Scientific Reports|November 27, 2025
Rotating compensator spectroscopic ellipsometry based on frequency division multiplexing with retardation calibrationJongkyoon Park, Alexander Gliserin, Sukhyun Choi, et al.
Biophysical Journal|April 6, 2011
Study of cell-matrix adhesion dynamics using surface plasmon resonance imaging ellipsometrySe-Hwa Kim, Won Chegal, Junsang Doh, et al.
Pageof 3