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Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|
December 11, 2013
Optimizing the precision of a multichannel three-polarizer spectroscopic ellipsometer
Won Chegal, Jeong Pyo Lee, Hyun Mo Cho, et al.
Optics Express
|
November 24, 2011
Snapshot phase sensitive scatterometry based on double-channel spectral carrier frequency concept
Daesuk Kim, Hyunsuk Kim, Robert Magnusson, et al.
Optics Express
|
January 5, 2024
Geometric analysis algorithm based on a neural network with localized simulation data for nano-grating structure using Mueller matrix spectroscopic ellipsometry
Juwon Jung, Kibaek Kim, Junho Choi, et al.
Optics Express
|
June 25, 2009
Angle-resolved annular data acquisition method for microellipsometry
Sang-Heon Ye, Soo Hyun Kim, Yoon Keun Kwak, et al.
Nanophotonics (Berlin, Germany)
|
February 20, 2025
Neural network-based analysis algorithm on Mueller matrix data of spectroscopic ellipsometry for the structure evaluation of nanogratings with various optical constants
Juwon Jung, Nagyeong Kim, Kibaek Kim, et al.
Biomaterials
|
November 9, 2010
Long-term stability of cell micropatterns on poly((3-(methacryloylamino)propyl)-dimethyl(3-sulfopropyl)ammonium hydroxide)-patterned silicon oxide surfaces
Woo Kyung Cho, Bokyung Kong, Hyung Ju Park, et al.
Optics Express
|
June 29, 2023
Robust dynamic spectroscopic imaging ellipsometer based on a monolithic polarizing Linnik interferometer
Gukhyeon Hwang, Inho Choi, Sukhyun Choi, et al.
Nanophotonics (Berlin, Germany)
|
December 22, 2025
AI-based analysis algorithm incorporating nanoscale structural variations and measurement-angle misalignment in spectroscopic ellipsometry
Juwon Jung, Leeju Hwang, Nagyeong Kim, et al.
ACS Nano
|
December 20, 2023
Heteronanostructured Field-Effect Transistors for Enhancing Entropy and Parameter Space in Electrical Unclonable Primitives
Jaeseo Park, Jung Woo Leem, Minji Park, et al.
Optics Express
|
August 5, 2014
Stokes vector measurement based on snapshot polarization-sensitive spectral interferometry
Daesuk Kim, Yoonho Seo, Moonseob Jin, et al.
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of 3
Search research articles
Search
Showing results (11-20 of 24) with videos related to
Sort By:
Page
of 3
Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|
December 11, 2013
Optimizing the precision of a multichannel three-polarizer spectroscopic ellipsometer
Won Chegal, Jeong Pyo Lee, Hyun Mo Cho, et al.
Optics Express
|
November 24, 2011
Snapshot phase sensitive scatterometry based on double-channel spectral carrier frequency concept
Daesuk Kim, Hyunsuk Kim, Robert Magnusson, et al.
Optics Express
|
January 5, 2024
Geometric analysis algorithm based on a neural network with localized simulation data for nano-grating structure using Mueller matrix spectroscopic ellipsometry
Juwon Jung, Kibaek Kim, Junho Choi, et al.
Optics Express
|
June 25, 2009
Angle-resolved annular data acquisition method for microellipsometry
Sang-Heon Ye, Soo Hyun Kim, Yoon Keun Kwak, et al.
Nanophotonics (Berlin, Germany)
|
February 20, 2025
Neural network-based analysis algorithm on Mueller matrix data of spectroscopic ellipsometry for the structure evaluation of nanogratings with various optical constants
Juwon Jung, Nagyeong Kim, Kibaek Kim, et al.
Biomaterials
|
November 9, 2010
Long-term stability of cell micropatterns on poly((3-(methacryloylamino)propyl)-dimethyl(3-sulfopropyl)ammonium hydroxide)-patterned silicon oxide surfaces
Woo Kyung Cho, Bokyung Kong, Hyung Ju Park, et al.
Optics Express
|
June 29, 2023
Robust dynamic spectroscopic imaging ellipsometer based on a monolithic polarizing Linnik interferometer
Gukhyeon Hwang, Inho Choi, Sukhyun Choi, et al.
Nanophotonics (Berlin, Germany)
|
December 22, 2025
AI-based analysis algorithm incorporating nanoscale structural variations and measurement-angle misalignment in spectroscopic ellipsometry
Juwon Jung, Leeju Hwang, Nagyeong Kim, et al.
ACS Nano
|
December 20, 2023
Heteronanostructured Field-Effect Transistors for Enhancing Entropy and Parameter Space in Electrical Unclonable Primitives
Jaeseo Park, Jung Woo Leem, Minji Park, et al.
Optics Express
|
August 5, 2014
Stokes vector measurement based on snapshot polarization-sensitive spectral interferometry
Daesuk Kim, Yoonho Seo, Moonseob Jin, et al.
Page
of 3