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Wouter Van den Broek

Showing results (1-10 of 14) with videos related to

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Physical Review Letters|February 2, 2013
Method for retrieval of the three-dimensional object potential by inversion of dynamical electron scatteringWouter Van den Broek, Christoph T Koch
Ultramicroscopy|July 17, 2012
A holographic method to measure the source size broadening in STEMJo Verbeeck, Armand Béché, Wouter Van den Broek
Ultramicroscopy|August 26, 2023
Convexity constraints on linear background models for electron energy-loss spectraWouter Van den Broek, Daen Jannis, Jo Verbeeck
Ultramicroscopy|July 23, 2013
Quantitative electron tomography: the effect of the three-dimensional point spread functionHamed Heidari, Wouter Van den Broek, Sara Bals
Ultramicroscopy|March 15, 2011
A practical method to determine the effective resolution in incoherent experimental electron tomographyHamed Heidari Mezerji, Wouter Van den Broek, Sara Bals
Optics Express|May 4, 2016
Inverse dynamical photon scattering (IDPS): an artificial neural network based algorithm for three-dimensional quantitative imaging in optical microscopyXiaoming Jiang, Wouter Van den Broek, Christoph T Koch
Ultramicroscopy|September 28, 2011
Introducing measure-by-wire, the systematic use of systems and control theory in transmission electron microscopyArturo Tejada, Arnold J den Dekker, Wouter Van den Broek
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 16, 2012
Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequencyWouter Van den Broek, Sandra Van Aert, Dirk Van Dyck
Ultramicroscopy|December 11, 2024
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimizationDaen Jannis, Wouter Van den Broek, Zezhong Zhang, et al.
Optics Express|September 29, 2020
Overcoming information reduced data and experimentally uncertain parameters in ptychography with regularized optimizationMarcel Schloz, Thomas Christopher Pekin, Zhen Chen, et al.
Pageof 2

Showing results (1-10 of 14) with videos related to

Sort By:
Pageof 2
Physical Review Letters|February 2, 2013
Method for retrieval of the three-dimensional object potential by inversion of dynamical electron scatteringWouter Van den Broek, Christoph T Koch
Ultramicroscopy|July 17, 2012
A holographic method to measure the source size broadening in STEMJo Verbeeck, Armand Béché, Wouter Van den Broek
Ultramicroscopy|August 26, 2023
Convexity constraints on linear background models for electron energy-loss spectraWouter Van den Broek, Daen Jannis, Jo Verbeeck
Ultramicroscopy|July 23, 2013
Quantitative electron tomography: the effect of the three-dimensional point spread functionHamed Heidari, Wouter Van den Broek, Sara Bals
Ultramicroscopy|March 15, 2011
A practical method to determine the effective resolution in incoherent experimental electron tomographyHamed Heidari Mezerji, Wouter Van den Broek, Sara Bals
Optics Express|May 4, 2016
Inverse dynamical photon scattering (IDPS): an artificial neural network based algorithm for three-dimensional quantitative imaging in optical microscopyXiaoming Jiang, Wouter Van den Broek, Christoph T Koch
Ultramicroscopy|September 28, 2011
Introducing measure-by-wire, the systematic use of systems and control theory in transmission electron microscopyArturo Tejada, Arnold J den Dekker, Wouter Van den Broek
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 16, 2012
Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequencyWouter Van den Broek, Sandra Van Aert, Dirk Van Dyck
Ultramicroscopy|December 11, 2024
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimizationDaen Jannis, Wouter Van den Broek, Zezhong Zhang, et al.
Optics Express|September 29, 2020
Overcoming information reduced data and experimentally uncertain parameters in ptychography with regularized optimizationMarcel Schloz, Thomas Christopher Pekin, Zhen Chen, et al.
Pageof 2