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Ultramicroscopy|August 26, 2023
Convexity constraints on linear background models for electron energy-loss spectraWouter Van den Broek, Daen Jannis, Jo VerbeeckUltramicroscopy|December 11, 2024
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimizationDaen Jannis, Wouter Van den Broek, Zezhong Zhang, et al.Ultramicroscopy|July 17, 2012
A holographic method to measure the source size broadening in STEMJo Verbeeck, Armand Béché, Wouter Van den BroekPhysical Review Letters|February 2, 2013
Method for retrieval of the three-dimensional object potential by inversion of dynamical electron scatteringWouter Van den Broek, Christoph T KochUltramicroscopy|July 23, 2013
Quantitative electron tomography: the effect of the three-dimensional point spread functionHamed Heidari, Wouter Van den Broek, Sara BalsUltramicroscopy|March 15, 2011
A practical method to determine the effective resolution in incoherent experimental electron tomographyHamed Heidari Mezerji, Wouter Van den Broek, Sara BalsOptics Express|May 4, 2016
Inverse dynamical photon scattering (IDPS): an artificial neural network based algorithm for three-dimensional quantitative imaging in optical microscopyXiaoming Jiang, Wouter Van den Broek, Christoph T KochScientific Reports|August 22, 2023
Deep learning for automated materials characterisation in core-loss electron energy loss spectroscopyArno Annys, Daen Jannis, Johan VerbeeckUltramicroscopy|September 28, 2011
Introducing measure-by-wire, the systematic use of systems and control theory in transmission electron microscopyArturo Tejada, Arnold J den Dekker, Wouter Van den BroekMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 16, 2012
Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequencyWouter Van den Broek, Sandra Van Aert, Dirk Van DyckPageof 7